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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
for production and quality control of monocrystalline Si ingots,bricks and wafers
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
High Resolution Resistivity Mapping Tool for process control and quality assurance measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument with a variable energy excitation source...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Malvern Panalytical, a leading analytical instrumentation supplier, today announces it has acquired the product line for six X-ray diffraction (XRD) products from Freiberg Instruments GmbH. The acquisition supports Malvern Panalytical's growth strategy, advancing its portfolio of market-leading analytical solutions for the semiconductor industry.
Semiconductor manufacturing increasingly relies on a variety of crystalline substrate materials, which are required to create thin wafers. As production processes become more advanced, and production volumes continue to grow, these wafers need to be produced quickly and efficiently, and precise crystal orientation and offcut angles are increasingly important. The acquired XRD systems allow rapid orientation of ingots and wafers, accelerating and simplifying the preparation of semiconductor substrates before epitaxy or lithography. This enhances yield, minimizes waste and reduces costs which supports our customers’ sustainability ambitions.
Lars Grieger, Business Development Manager of Semiconductor Metrologyat Malvern Panalytical, said: “The addition of these specialized products to our analytical portfolio enables innovative crystal orientation control. When combined with Malvern Panalytical’s global presence and expertise, this provides a significant boost to the semiconductor wafer industry. This is a hugely exciting time for Malvern Panalytical, and we are looking forward to help realize the future of semiconductor metrology for our customers.”
Kay Dornich, CEO/Owner, Freiberg Instruments GmbH, said: “Our XRD solutions, with their ultra-fast Omega Scan technology, have consistently demonstrated their value to semiconductor manufacturers. Their speed, robustness, and reliability make them an excellent addition to Malvern Panalytical's portfolio and I’m excited to see these unique technologies made available to customers across the globe. At Freiberg Instruments, we will continue to support our existing customers and maintain our offering of specialized solutions, including those for automated workflows, which complement Malvern Panalytical’s newly acquired X-ray diffraction instruments.”
Mark Fleiner, President, Malvern Panalytical, added: “We’re incredibly dedicated to delivering exceptional, cutting-edge solutions to our customers across every industry we operate in. The acquisition of these six X-ray diffraction instruments from Freiberg Instruments GmbH underpins our commitment to our semiconductor customers and demonstrates our desire to become the chosen instrument supplier within this exciting area of analysis.
More information about these instruments can be found on website.
For more information, contact Mr. Thanga Kumar, Head of Sales & Marketing, at thanga.kumar(at)freiberginstruments.com. Corporate Headquarters Freiberg Instruments GmbH Delfter Str. 6 D-09599 Freiberg Germany
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