New papers published

Oct 05, 2010

Category: Inline Metrology

N. Schüler, T. Hahn, K. Dornich and J.R. Niklas:
Spatially resolved determination of trapping parameters in P-doped silicon by microwave detected photoconductivity
25th EUPVSEC Valencia, Spain

N. Schüler, D. Mittelstrass, K. Dornich and J.R. Niklas:
High resolution inline detection of changes in the conduction type of multicrystalline silicon by contact less photoconductivity measurements
35th IEEE Photovoltaic Specialists conference, Honolulu Hawaii

N. Schüler, D. Mittelstrass, K. Dornich, J.R. Niklas and H. Neuhaus:
Next generation inline minority carrier lifetime metrology on multicrystalline silicon bricks for pv
35th IEEE Photovoltaic Specialists conference, Honolulu Hawaii

N. Schüler, T. Hahn, K. Dornich, J.R. Niklas:
Versatile simulation tool and novel measurement method for electrical characterization of semiconductors
Solid State Phenomena 156-158, 241-246 (2010)

N. Schüler, T. Hahn, S. Schmerler, S. Hahn, K. Dornich and J.R. Niklas:
Simulations of photoconductivity and lifetime for steady state and nonsteady state measurements
Journal of Applied Physics 107 (2010), 064901

N. Schüler, T. Hahn, K. Dornich, J.R. Niklas, B. Gründig-Wendrock:
Theoretical and experimental comparison of contactless lifetime measurement methods for thick silicon samples
Solar Energy Materials & Solar Cells 94 (2010), 1076-1080

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25.09.12

27th PVSEC in Frankfurt (Germany)

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03.04.12

SiliconPV 2012 in Leuven (Belgium)

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16.03.12

SNEC 6th in Shanghai (China)

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