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- MDPmap|research tool with versatile measurement options
- New option for temperature |dependent measurements!
- New laser options for the MDPmap!
- Fast wafer mapping|with the MDPinline tool series
MDPmap|research tool with versatile measurement options
The MDPmap enables the continous variation of the excitation pulse width from very short pulse measurements (100 ns) to steady state measurements (several ms), enabling to investigate defect dynamics and the lifetime properties of a sample in different depth. learn more
 MDPinline |
 MDPmap |
 MDPingot |
 MDPinline ingot |
 MDPlinescan |
 MDPspot |
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Microelectronic Industry
Application of contactless electrical characterization techniques for process control has a huge potential for process improvement in many fabs.
Freiberg Instruments provides versatile tools needed to assure high quality
standards and high yields
Photovoltaic Industry
Minority carrier lifetime, photoconductivity and resistivity can be measured at bricks and wafers at different preparation stages allowing for production control and yield improvement.
The MDP series tools are the perfect match for delivering high quality solar
panels at low prices.
Research and Development
Facing high costs, long timescales and often uncertain outcomes research and development applications are often in need of customized and highly sensitive measuring solutions.
Freiberg Instruments equipement is ideal for research purposes and even customized
solutions are possible.
Overview - delivering solutions for a broad range of applications
Microwave detected photoconductivity
Next generation contactless measurement heads with so far not seen sensitivity allow for high speed semiconductor characterisation at µ-PCD or steady state excitation conditions over a wide range of injection levels from ultra low to high injection.
Key facts
full two dimensional wafer maps of minority carrier lifetime in less than 1 second allow for low cost statistical process control and material quality characterisation
ingot maps with 1 mm resolution are taken in less than two minutes, two block sides at the same time
simultaneous measurement of minority carrier lifetime, photoconductivity and resistivity maps
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