PIDcon | benchtop PID test solution

Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).

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MDPinline

MDPinline

MDPmap

MDPmap

MDPingot

MDPingot

MDPinline ingot

MDPinline ingot

MDPlinescan

MDPlinescan

MDPspot

MDPspot

Microelectronic Industry

Application of contactless electrical characterization techniques for process control has a huge potential for process improvement in many fabs.

Freiberg Instruments provides versatile tools needed to assure high quality
standards and high yields

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Photovoltaic Industry

Minority carrier lifetime, photoconductivity and resistivity can be measured at bricks and wafers at different preparation stages allowing for production control and yield improvement.

The MDP series tools are the perfect match for delivering high quality solar

panels at low prices.

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Research and Development

Facing high costs, long timescales and often uncertain outcomes research and development applications are often in need of customized and highly sensitive measuring solutions.

Freiberg Instruments equipement is ideal for research purposes and even customized
solutions are possible.

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Overview - delivering solutions for a broad range of applications

Microwave detected photoconductivity

Next generation contactless measurement heads with so far not seen sensitivity allow for high speed semiconductor characterisation at µ-PCD or steady state excitation conditions over a wide range of injection levels from ultra low to high injection.

Key facts

  • full two dimensional wafer maps of minority carrier lifetime in less than 1 second allow for low cost statistical process control and material quality characterisation

  • ingot maps with 1 mm resolution are taken in less than two minutes, two block sides at the same time

  • simultaneous measurement of minority carrier lifetime, photoconductivity and resistivity maps

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There is a wide variety of application for minority carrier lifetime measurement tools. Case studies and examples are added constantly.

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Freiberg Instruments located in the heart of silicon Saxony focuses on state of the art contactless electrical characterisation tools for fab and lab applications.

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Robust design and long standing quality with little to no maintenance make our tools a reliable partner for your metrology needs.

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