Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).
Minority carrier lifetime, photoconductivity and resistivity can be measured at bricks and wafers at different preparation stages allowing for production control and yield improvement.
The MDP series tools are the perfect match for delivering high quality solar
panels at low prices.
Facing high costs, long timescales and often uncertain outcomes research and development applications are often in need of customized and highly sensitive measuring solutions.
Freiberg Instruments equipement is ideal for research purposes and even customized
solutions are possible.
Next generation contactless measurement heads with so far not seen sensitivity allow for high speed semiconductor characterisation at µ-PCD or steady state excitation conditions over a wide range of injection levels from ultra low to high injection.
full two dimensional wafer maps of minority carrier lifetime in less than 1 second allow for low cost statistical process control and material quality characterisation
ingot maps with 1 mm resolution are taken in less than two minutes, two block sides at the same time
simultaneous measurement of minority carrier lifetime, photoconductivity and resistivity maps