Category: Inline Metrology Feb 24, 2015
Paul M. Jordan, Daniel K. Simon, Thomas Mikolajick, and Ingo Dirnstorfer
BiasMDP: Carrier lifetime characterization technique with applied bias voltage
Category: Inline Metrology Sep 24, 2014
SEA4KET is an EC-funded project covering semiconductor equipment assessment to strengthen the European semiconductor equipment industry.
Scaling up MDP technology to 450 mm wafer diameter, the next generation characterisation...
Category: Inline Metrology Jun 11, 2014
Come visit Freiberg Instruments at Booth# E 10 in Hall 1 at the PVSEC 2014, Amsterdam, Netherlands between 23 - 25 September, 2014 to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells...
Category: Inline Metrology May 19, 2014
May 20, 2014 - May 22, 2014
Category: Inline Metrology May 08, 2014
Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination
Category: Inline Metrology Jan 13, 2014
Freiberg Instruments is pleased to announce our recent acquisition of Magnettech GmbH, Berlin. Dr. Kay Dornich is the CEO of Magnettech GmbH succeeding Dr. Eberhard Friese who has over 20 years of experience in the field of...
Category: Inline Metrology Sep 30, 2013
Come visit Freiberg Instruments at booth# 2/A8 (Hall 2- Saxony Pavilion) at PVSEC 2013, Paris, France from 30 September till 04 October, 2013 to have a first look at our new Potential Induced Degradation control device (PIDcon)...