News

News

Category: Inline Metrology Jun 26, 2015

EU PVSEC - Hamburg

Come visit Freiberg Instruments at the PVSEC 2015 (Booth No. E4 - Hall-H), in CCH-Congress Center Hamburg, Germany between 15 - 17 September to have a look at our new Potential Induced Degradation control device (PIDcon) for...


Category: Inline Metrology Jun 01, 2015

Neuheiten für mehr Effizienz und Zuverlässigkeit-

Fraunhofer CSP auf der Intersolar Europe


Category: Inline Metrology May 21, 2015

Prüfgerät erkennt PID-Effekt auf Zellenebene

Fraunhofer CSP für Intersolar Award nominiert


Category: Inline Metrology Feb 24, 2015

Recently Published

Paul M. Jordan, Daniel K. Simon, Thomas Mikolajick, and Ingo Dirnstorfer
BiasMDP: Carrier lifetime characterization technique with applied bias voltage


Category: Inline Metrology Sep 24, 2014

SEA4KET Project

SEA4KET is an EC-funded project covering semiconductor equipment assessment to strengthen the European semiconductor equipment industry.
Scaling up MDP technology to 450 mm wafer diameter, the next generation characterisation...


Category: Inline Metrology Jun 11, 2014

29th EU PVSEC - Amsterdam

Come visit Freiberg Instruments at Booth# E 10 in Hall 1 at the PVSEC 2014, Amsterdam, Netherlands between 23 - 25 September, 2014 to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells...


Category: Inline Metrology May 19, 2014

SNEC 2014 PV Power Expo

May 20, 2014 - May 22, 2014


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