Category: Inline Metrology Jun 26, 2015
Come visit Freiberg Instruments at the PVSEC 2015 (Booth No. E4 - Hall-H), in CCH-Congress Center Hamburg, Germany between 15 - 17 September to have a look at our new Potential Induced Degradation control device (PIDcon) for...
Category: Inline Metrology Jun 01, 2015
Fraunhofer CSP auf der Intersolar Europe
Category: Inline Metrology May 21, 2015
Fraunhofer CSP für Intersolar Award nominiert
Category: Inline Metrology Feb 24, 2015
Paul M. Jordan, Daniel K. Simon, Thomas Mikolajick, and Ingo Dirnstorfer
BiasMDP: Carrier lifetime characterization technique with applied bias voltage
Category: Inline Metrology Sep 24, 2014
SEA4KET is an EC-funded project covering semiconductor equipment assessment to strengthen the European semiconductor equipment industry.
Scaling up MDP technology to 450 mm wafer diameter, the next generation characterisation...
Category: Inline Metrology Jun 11, 2014
Come visit Freiberg Instruments at Booth# E 10 in Hall 1 at the PVSEC 2014, Amsterdam, Netherlands between 23 - 25 September, 2014 to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells...
Category: Inline Metrology May 19, 2014
May 20, 2014 - May 22, 2014