News

News

Category: Inline Metrology May 04, 2015

EU PVSEC - Hamburg

Come visit Freiberg Instruments at the PVSEC 2015, Hamburg, Germany between 15 - 17 September to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells and encapsulation films developed as...


Category: Inline Metrology Feb 24, 2015

Recently Published

Paul M. Jordan, Daniel K. Simon, Thomas Mikolajick, and Ingo Dirnstorfer
BiasMDP: Carrier lifetime characterization technique with applied bias voltage


Category: Inline Metrology Sep 24, 2014

SEA4KET Project

SEA4KET is an EC-funded project covering semiconductor equipment assessment to strengthen the European semiconductor equipment industry.
Scaling up MDP technology to 450 mm wafer diameter, the next generation characterisation...


Category: Inline Metrology Jun 11, 2014

29th EU PVSEC - Amsterdam

Come visit Freiberg Instruments at Booth# E 10 in Hall 1 at the PVSEC 2014, Amsterdam, Netherlands between 23 - 25 September, 2014 to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells...


Category: Inline Metrology May 19, 2014

SNEC 2014 PV Power Expo

May 20, 2014 - May 22, 2014


Category: Inline Metrology May 08, 2014

Potential-Induced Degradation (PID)

Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination


Category: Inline Metrology Jan 13, 2014

Acquisition of Magnettech GmbH

Freiberg Instruments is pleased to announce our recent acquisition of Magnettech GmbH, Berlin. Dr. Kay Dornich is the CEO of Magnettech GmbH succeeding Dr. Eberhard Friese who has over 20 years of experience in the field of...


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