News

News

Category: Inline Metrology Mar 18, 2014

29th EU PVSEC - Amsterdam

Come visit Freiberg Instruments at PVSEC 2014, Amsterdam, Netherlands between 23 - 25 September, 2014 to have a look at our new Potential Induced Degradation control device (PIDcon) for solar cells and encapsulation films...


Category: Inline Metrology Jan 13, 2014

Acquisition of Magnettech GmbH

Freiberg Instruments is pleased to announce our recent acquisition of Magnettech GmbH, Berlin. Dr. Kay Dornich is the CEO of Magnettech GmbH succeeding Dr. Eberhard Friese who has over 20 years of experience in the field of...


Category: Inline Metrology Sep 30, 2013

28th EU PVSEC

Come visit Freiberg Instruments at booth# 2/A8 (Hall 2- Saxony Pavilion) at PVSEC 2013, Paris, France from 30 September till 04 October, 2013 to have a first look at our new Potential Induced Degradation control device (PIDcon)...


Category: Inline Metrology Sep 16, 2013

Potential Induced Degradation (PIDcon)

Potential Induced Degradation control device (PIDcon) for solar cells and encapsulation films developed as a bench top metrology solution by our team of engineers based on the knowledge of Fraunhofer CSP in Halle, Germany (Patent...


Category: Inline Metrology Jul 21, 2013

27th International Conference on Defects in Semiconductors 2013

Meet us at the 27th ICDS in Bologna, Italy from 21 to 26 July 2013.
http://www.icds2013.eu/


Category: Inline Metrology Jun 18, 2013

New option for temperature dependent measurements released

A new option for the MDPmap was released! 
For temperature dependent measurements or annealing treatments, e.g. for CrB or FeB detection, the new heatable chuck for the MDPmap is now available.


Category: Inline Metrology Jun 10, 2013

New job opportunities

Have a look at our new job opportunities!
read more


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