Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).

Benchtop PID test solution

The Freiberg Instruments PIDcon allows routine quality control of standard production solar cells, test of new production processes, material or layer variations and qualification for various solar cell technologies as well as evaluation of impacts from various module setups.

  • PID testing without manufacturing of mini modules, no climate chamber necessary

    • PIDcon measurements replace climate chamber measurements

    • Measurements are possible early in production process without lamination

  • designed for flexible research work as well as routine production quality control

    • PID test procedure for solar cells and module components (glass, polymer sheets)

    • Use of standard encapsulation materials

Failures of crystalline silicon solar modules under the influence of high system voltage have been first reported in 2010. Affected solar cells show an extreme drop of the shunt resistance. The effect was termed Potential Induced Degradation (PID).  

Until now PID tests are principally conducted at modules. Manufacturing of modules and climate chamber testing require considerable expenses for materials, equipment and work.

PIDcon has been developed based on the knowledge of Fraunhofer CSP in order to combine the advantages of established test procedures: realistic PID test conditions like in module based PID tests together with low expenditure on time and costs. The PIDcon device reproduces a typical module stack on the surface of solar cell test samples. The sample undergoes the same voltage stress as in conventional module tests. Also glass sheets or polymer encapsulants can be tested with respect to their specific PID susceptibility when PID sensitive cells are used.


  • Measurement and recording of shunt resistivity

  • Designed for PID save production

  • No lamination of modules needed

  • Time and cost saving compared to climate chamber PID tests on modules

  • Individual design for experimental research possible

  • Predefined recipes for routine operation

  • Easy to use, compact design

  • All in one system, no external periphery electronics

  • IEC 62804 TS: Test methods for detection of potential-induce degradation of crystalline silicon photovoltaic (PV) modules

Technical specifications

PIDcon size300 x 350 x 208 mm
sample size156 x 156 mm (125 x 125 mm option), standard two or three busbar cells, others on request
Measurement timeminutes to days as required


  • Manual loading

  • Electrode 100 x 100 mm, high voltage can be selected 0.1 to 1.5 kV

  • Dark measurements

  • Adjustable temperature up to 150 °C, typical measurement condition 85 °C

  • Humidity measurement

  • CE conform