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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Offline tool for very versatile contactless electrical characterization of semiconductor wafers or partially processed wafers....
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished.
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test solution
for fast and routine production level quality control of solar cells
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
for ultra-fast crystal orientation and rocking curve measurements
flexible diffractometer for ultra-fast Omega Scan orientation determination
for AT, SC, FC, IT cut Blanks
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).
The Freiberg Instruments PIDcon allows routine quality control of standard production solar cells, test of new production processes, material or layer variations and qualification for various solar cell technologies as well as evaluation of impacts from various module setups.
PID testing without manufacturing of mini modules, no climate chamber necessary
PIDcon measurements replace climate chamber measurements
Measurements are possible early in production process without lamination
designed for flexible research work as well as routine production quality control
PID test procedure for solar cells and module components (glass, polymer sheets)
Use of standard encapsulation materials
Failures of crystalline silicon solar modules under the influence of high system voltage have been first reported in 2010. Affected solar cells show an extreme drop of the shunt resistance. The effect was termed Potential Induced Degradation (PID).
Until now PID tests are principally conducted at modules. Manufacturing of modules and climate chamber testing require considerable expenses for materials, equipment and work.
PIDcon has been developed based on the knowledge of Fraunhofer CSP in order to combine the advantages of established test procedures: realistic PID test conditions like in module based PID tests together with low expenditure on time and costs. The PIDcon device reproduces a typical module stack on the surface of solar cell test samples. The sample undergoes the same voltage stress as in conventional module tests. Also glass sheets or polymer encapsulants can be tested with respect to their specific PID susceptibility when PID sensitive cells are used.
Measurement and recording of shunt resistivity
Designed for PID save production
No lamination of modules needed
Time and cost saving compared to climate chamber PID tests on modules
Individual design for experimental research possible
Predefined recipes for routine operation
Easy to use, compact design
All in one system, no external periphery electronics
IEC 62804 TS: Test methods for detection of potential-induce degradation of crystalline silicon photovoltaic (PV) modules
Electrode 100 x 100 mm, high voltage can be selected 0.1 to 1.5 kV
Adjustable temperature up to 150 °C, typical measurement condition 85 °C