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MDP Series
 MDP map |
 MDP ingot |
 MDP spot |
 MDP inline |
 MDP inline ingot |
 MDP linescan |
Case studies
There is a big variety of applications for minority carrier lifetime measurement tools. Case studies and examples are added constantly.
Overview MDP-Series
MDP map
Offline tool for very versatile contactless electrical characterisation of semiconductor wafers or...
MDP linescan
Flexible OEM unit for lifetime measurements at a variety of different samples ranging form mono to multi...
MDP inline ingot
State of the art system for topographic electrical characterisation of multicrystalline bricks in fabs with...
MDP inline
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one...
MDP ingot
Electrical characterisation tool for mapping of bricks (or wafers) with mea- surement times of less than four...
News
Microwave detected photoconductivity is a newly developed technology with a so far unsurpased combination of sensitivity, speed and resolution for fab and lab applications.
Freiberg Instruments GmbH | Am St. Niclas Schacht 13 | D-09599 Freiberg/Germany || t +49 3731 41954 0 | f +49 3731 41954 14 || contact | how to find us || creation: 599media GmbH