MDP Series

MDP ingot

MDP ingot

MDP inline

MDP inline

MDP linescan

MDP linescan

MDP map

MDP map

MDP spot

MDP spot

Case studies

There is a big variety of applications for minority carrier lifetime measurement tools. Case studies and examples are added constantly.

 

 

 

 

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Branch Solutions

We offer solutions for certain industries such as solar and microelectronics.

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MDP inline

MDP inline

Production in­te­grated high speed wafer mapping suit­able for single wafer in­vesti­gation...

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MDP inline ingot

State of the art system for electrical characterisation of multicrystalline ingots in fabs with high...

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MDP spot

MDP spot

Low cost table top lifetime measure­­ment system for characterisation of a variety of different silicon...

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MDP map

MDP map

Offline tool for very versatile contact­less electrical characterisation of semi­conductor wafers or...

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MDP linescan

MDP linescan

Flexible OEM unit for lifetime measurements at a variety of different samples ranging form mono to multi...

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MDP ingot

MDP ingot

Electrical characterisation tool for mapping of ingots and wafers with measurement times of less than ten...

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