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MDP Series
 MDP ingot |
 MDP inline |
 MDP linescan |
 MDP map |
 MDP spot |
MDP inline
Production integrated high speed wafer mapping suitable for single wafer investigation...
MDP inline ingot
State of the art system for electrical characterisation of multicrystalline ingots in fabs with high...
MDP spot
Low cost table top lifetime measurement system for characterisation of a variety of different silicon...
MDP map
Offline tool for very versatile contactless electrical characterisation of semiconductor wafers or...
MDP linescan
Flexible OEM unit for lifetime measurements at a variety of different samples ranging form mono to multi...
MDP ingot
Electrical characterisation tool for mapping of ingots and wafers with measurement times of less than ten...
News
Microwave detected photoconductivity is a newly developed technology with a so far unsurpased combination of sensitivity, speed and resolution for fab and lab applications.
Freiberg Instruments GmbH | Am St. Niclas Schacht 13 | D-09599 Freiberg/Germany || t +49 3731 41954 0 | f +49 3731 41954 14 || contact | how to find us || creation: 599media GmbH