There is a big variety of applications for minority carrier lifetime measurement tools. Case studies and examples are added constantly.
Offline tool for very versatile contactless electrical characterisation of semiconductor wafers or...
Flexible OEM unit for lifetime measurements at a variety of different samples ranging form mono to multi...
State of the art system for topographic electrical characterisation of multicrystalline bricks in fabs with...
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one...
Electrical characterisation tool for mapping of bricks (or wafers) with mea- surement times of less than four...
