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Branches OverviewContacless measurement of properties like minority carrier lifetime, photoconductivity and resistivity has a wide range of applications for semiconductor characterisation – focus is put on the prediction of device performance at early production stages
The application of contactless electrical characterisation technologies has a wide range of application. Covering a fast number of different semiconductors direct and indirect ones from silicon to GaAs, InP, GaN, SiC, CdTe, HgCdTe at a variety of different preparation stages. Within samples without defined shape to ingots to bare wafers to structured wafers of different preparation stages to final devices can be investigated without any pre preparation, no contacts are necessary, there is no impact to the samples at all.
Worldwide the biggest semiconductor demand is based on silicon therefore the biggest market share and branch solutions are in classical semiconductor industrie and in photovoltaic industrie. However we are constantly working on solutions to fit other demands as well. Starting at customised solutions which are specialised for certain needs which include development too.
Minority carrier lifetime, photoconductivity and resistivity can be measured at bricks and wafers at different preparation stages allowing for production control and yield improvement.
Application of contactless electrical characterisation techniques for process control has a big capacity for process improvement in many fabs.
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