home | contact | legal | print page
State of the art system for topographic electrical characterisation of multicrystalline bricks in fabs with high throughput. Total measurement times of less than two minutes at 1 mm resolution, two brick sides simultaneously.
MDP inline ingot - fast ingot mapping system for high throughput multicristalline silicon fabs
MDPinline ingot systems are worldwide the fastest measurement tools available for electrical characterisation of multicrystalline silicon bricks. They are designed for single brick investigation in high throughput production fabs. Every brick can be measured on two sides in less than two minutes all maps at the same time. Measurement parameters are lifetime and conduction type equivalent maps with 1 mm resolution as well as resistivity linescans.
The system includes a database and statistical data evaluation which can be used for automated determination of precise cut positions for yield improvement, for material quality monitoring and for furnace selection and process improvement.
Facts
contactless destruction free electrical semiconductor characterisation
mapping capability of minority carrier lifetime
advanced sensitivity for visualisation of so far invisible defects
automated cut criteria definition
steady state measurements for extraction of bulk properties
completely automated for inline integration
2-dimensional brick mapping system for solar grade silicon, one millimetre resolution, measurement time: one ingot in less than 2 minutes, 2 surfaces at a time
Advantages
World record speed for inline multicrystalline silicon brick characterisation for advanced PV fabs. Measurement of carrier lifetime with one millimeter resolution in less than two minutes at two brick sites. Spatial resolved measurement of conduction type changes as well as resistivity linescans are measured at the same time.
Customer defined brick cut criteria can be transmitted to the fab database which allows a fully automated material monitoring for next generation photovoltaic fabs. Enables material quality control and monitoring of furnace performance, and failure analysis.
Special “underneath the surface” measurement technique reduces distortion of data by surface recombination considerably.
Detail
fully automated
ingot maps and linescans
Options
resistivity map with 1 cm² resolution
p/n equivalent map with 1 mm² resolution
iron mapping capability
Specifications
sample: multi silicon brick
sample size: between 125 x 125 to 210 x 210 mm²
maximum brick length: 600 mm
resistivity: 0.2 - 10³ Ohm cm
conduction type: p, n
material: multicrystalline silicon
properties measureable: lifetime (steady state or non equilibrium (μ-PCD) selectable), photoconductivity
excitation: 980 nm default
measurement time depending on sample: for instance 1 mm resolution 156 x 156 mm², 300 mm : much less than two minutes
dimension: 2300 x 800 x 1200 mm, weight: 250 kg
power: 110/220V, 50/60 Hz, 8 A
News
Freiberg Instruments GmbH | Am St. Niclas Schacht 13 | D-09599 Freiberg/Germany || t +49 3731 41954 0 | f +49 3731 41954 14 || contact | how to find us || creation: 599media GmbH