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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Offline tool for very versatile contactless electrical characterization of semiconductor wafers or partially processed wafers....
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished.
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test solution
for fast and routine production level quality control of solar cells
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
for ultra-fast crystal orientation and rocking curve measurements
flexible diffractometer for ultra-fast Omega Scan orientation determination
for AT, SC, FC, IT cut Blanks
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
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Our quality management system is an integrated process-oriented system with ISO 9001 certification.
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For microelectronics, and other microstructure technologies, crystalline wafers are the most important substrate material. In high-throughput applications like wafer sorting and quality control, the Omega Scan plays its speed advantage.
About 50000 tons of monocrystalline Silicon are grown each year for the production of wafers. Other semiconductors like Ge and GaAs are used in smaller quantities for special applications like high electron mobility devices. In the recent years, wide-bandgap (WBG) semiconductors like GaN are introduced for a large range of applications in diodes and power semiconductors. This has caused a drastic increase in the production of sapphire wafers, which are used as substrate for thin films of GaN. The crystal growth of III-V compounds like GaN and AlN or the WBG semiconductor SiC is a very complex process due to the fact that it takes place in the gas-solid equilibrium. However the production of wafers of these materials is increasing.
The traditional semiconductors have cubic crystal structures of the close packed type. GaN and AlN crystallize in the hexagonal Wurtzite structure. SiC is known for its polymorphism; most of the polymorph structures are based on Wurtzite. The crystal structure of Sapphire is trigonal R centered.
With its high speed and precision, the Omega Scan technique is ideal for sorting applications. We can characterize a wafer by its surface tilt vector and an in-plane direction, for instance the perpendicular of the flat. All that information can be gathered by a single Omega Scan measurement.
For all established wafer materials and orientations, Omega Scan solutions are available. In SiC, it is possible to detect and separate the most common polymorphs, 4H and 6H.
For high-throughput applications like wafer sorting, we offer automated wafer handling using market-available solutions. The instruments' capabilities can be extended by an additional sensor to determine warp and bow of the wafer.