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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test for solar wafers and mini-modules
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
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Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
Processing large single crystals for wafer production is a key to success in the semiconductor and crystal industry. During sawing and grinding, the control of the orientation ensures a good product quality.
Synthetic single crystals for industrial applications are often large and heavy and require special adaptations for sample holders and supports. The main purpose of XRD measurements on such materials is to identify and control the orientation of the crystal lattice during several work steps. Technical crystals are often cut into wafers, e.g. semiconductor crystals like Si, Ge, GaAs or SiC. The processing takes several steps of sawing and grinding, during which the crystals must to be aligned in the target orientation.
An example for an adjustable crystal holder is a device for stacking oriented ingots. Using an ingot stack instead of shorter single pieces helps to use the available sawing equipment more efficiently. After an Omega Scan the orientation of an ingot in the crystal holder is known. The software calculates the necessary adjustments to reach a given target orientation. The user is then presented with detailed instructions how to operate the adjustment screws of the equipment. Due to the quick measurement, a sequence of repeated orientation and controlling steps does not require too much time.
For some applications it is important to determine the orientation with respect to the actual surface. By measuring the inclination of this surface versus the rotation axis of the crystal, the Omega/Theta instrument can provide a correction for the error resulting from the surface misalignment.