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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test solution
for fast and routine production level quality control of solar cells
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
for ultra-fast crystal orientation and rocking curve measurements
flexible diffractometer for ultra-fast Omega Scan orientation determination
for AT, SC, FC, IT cut Blanks
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
Our diffractometers are designed especially for large and heavy synthetic single crystals.
Synthetic single crystals for industrial applications are often large and heavy and require special adaptations for sample holders and supports. The main purpose of XRD measurements on such materials is to identify and control the orientation of the surface during several work steps. Thus the measurement works in a reflecting beam geometry. During growth, the crystal gets its initial orientation from a seed crystal. If no seed is used, in most cases the crystal shape and growth direction present good indicators for the crystal orientation. This pre-existing knowledge about the approximate orientation allows to use a fast and precise measurement technique, that we call the Omega Scan.
Our diffractometers are built especially with large single crystals in mind. The sample supporting plate can carry up to 30 kg in the basic version. Single crystals or crystal orientation units up to 400 mm length can be measured. Our engineers design and build specialized sample holders to the customers' requirements. Using customized sample holders, the same machine can be employed to measure the grown crystal, an ingot and individual wafers. The inclination of the measured crystal surface with respect to the rotation plane is detected and can be corrected.
The Omega Scan has been adapted to many different material systems. If more flexibility is needed, we recommend an additional Theta Scan capability.