Potential Induced Degradation (PID) is a critical reliability issue in PV power plants, making it essential to assess products for their susceptibility to PID. The PIDcon system helps manufacturers test products earlier in the production chain, such as mini-modules. The PID in question refers to the shunting of solar cells caused by high-voltage stress-induced leakage currents (PID-s).
Mini-modules are contacted at two points, with a contact check ensuring proper connection.
The PIDStudio software allows users to define pass/fail criteria and also provides recommended settings based on IEC standards and the expertise of Fraunhofer CSP scientists.
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