for ultra-fast crystal orientation and rocking curve measurements


The Omega/Theta X-ray diffractometer is a fully automated vertical three axes diffractometer for orientation determination for various crystals using Omega-Scan and Theta-Scan methods and rocking curve measurements. The large and spacious design can accomodate samples and sample holders up to 450 mm in length and up to 30 kg weight.

All measurements are automated and can be accessed from the user-friendly software interface. Using the Omega Scan, the complete lattice orientation can be determined in on crystal rotation (5 seconds). The Theta Scan is more flexible, but results only in one orientation component per scan.

The tilt angle can be determined with very high precision; up to 0.001° using the Theta Scan. For all other crystal directions the precision depends on the angular difference to the surface perpendicular.

The system is modular and has been equipped with many different extensions for special purposes like shape or flat determination, mapping and diverse sample holders. The sample tilt is detected by an optical measurement, and can be used to correct the resulting orientation.

Add ons

  • Laser scanner for sample shape measurement

  • Photographic camera and image processing for flat and notch detection

  • Additional sample rotation axis for 3D mapping

  • Secondary channel-cut collimator (analyzer)

  • Equipment for sample adjustment

Single crystal diffractometer

  • Fully automated complete lattice orientation measurement of single crystals

  • Ultra-fast crystal orientation measurement using Omega-scan method

  • Automated rocking-curve measurement

  • Angular resolution of the diffractometer: 0.1 arc sec.

  • Sample size up to 450 mm

  • Appropriate for production quality control and research

User friendly and cost effective

  • Convenient sample handling and easy to operate

  • Advanced, user-friendly software

  • Low energy consumption and operating costs

Modular design and flexibility

  • Various upgrade options

  • Customization to the users' requirements

Omega-scan diagram (SiC)
Turbine blade, map of one orientation component
(Si, Ge) wafer, orientation map
lattice parameter map

Technical specifications

X-ray sourceStandard X-ray tube, Cu anode
DetectorScintillation counter (single or double)
Sample holderPrecise turntable (accuracy 0.01°), mounting plate and tools for sample adjustment
Crystal collimatorPrimary Ge or Si channel-cut collimator, measurable minimal broadening: < 10 arc sec
Mappingx-y table, lateral resolution 0.1 mm
DimensionsH 1950 mm × D 820 mm × W 1200 mm
Weight650 kg
Power supply208-240 V, 16 A single phase, 50-60 Hz
Water coolingFlow – 4l/min, max. pressure 8 bar, T ≤ 30° C

Ultra-fast Omega-scan approach

  • 200 times faster than Theta-scan method

  • Automatic evaluation of the complete lattice orientation in 3D

  • Determination of crystal orientation within 5 seconds

For research and production quality control

  • Omega/Theta-scan in a single device

  • Azimuthal setting and marking of crystal orientation

  • Highest precision, i.e. up to (1/1000)°

  • Rocking curve measurement using Theta-scan method

Special adaptations

  • Determination of lattice parameters [(Si, Ge) solid solutions]

  • High-resolution diffraction (reciprocal-lattice mapping)

Applications for Omega/Theta