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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Offline tool for very versatile contactless electrical characterization of semiconductor wafers or partially processed wafers....
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished.
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test solution
for fast and routine production level quality control of solar cells
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
for ultra-fast crystal orientation and rocking curve measurements
flexible diffractometer for ultra-fast Omega Scan orientation determination
for AT, SC, FC, IT cut Blanks
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
for ultra-fast crystal orientation and rocking curve measurements
The universal Omega/Theta X-ray diffractometer is a fully automated vertical three axes diffractometer for orientation determination for various crystals using Omega-Scan and Theta-Scan methods and rocking curve measurements. The large and spacious design can accomodate samples and sample holders up to 450 mm in length and up to 30 kg weight.
All measurements are automated and can be accessed from the user-friendly software interface. Using the Omega Scan, the complete lattice orientation can be determined in on crystal rotation (5 seconds). The Theta Scan is more flexible, but results only in one orientation component per scan.
The tilt angle can be determined with very high precision; up to 0.001° using the Theta Scan. For all other crystal directions the precision depends on the angular difference to the surface perpendicular.
The system is modular and has been equipped with many different extensions for special purposes like shape or flat determination, mapping and diverse sample holders. The sample tilt is detected by an optical measurement, and can be used to correct the resulting orientation.
Laser scanner for sample shape measurement
Photographic camera and image processing for flat and notch detection
Additional sample rotation axis for 3D mapping
Secondary channel-cut collimator (analyzer)
Equipment for sample adjustment
Single crystal diffractometer
Fully automated complete lattice orientation measurement of single crystals
Ultra-fast crystal orientation measurement using Omega-scan method
Automated rocking-curve measurement
Angular resolution of the diffractometer: 0.1 arc sec.
Sample size up to 450 mm
Appropriate for production quality control and research
User friendly and cost effective
Convenient sample handling and easy to operate
Advanced, user-friendly software
Low energy consumption and operating costs
Modular design and flexibility
Various upgrade options
Customization to the users' requirements
Ultra-fast Omega-scan approach
200 times faster than Theta-scan method
Automatic evaluation of the complete lattice orientation in 3D
Determination of crystal orientation within 5 seconds
For research and production quality control
Omega/Theta-scan in a single device
Azimuthal setting and marking of crystal orientation
Highest precision, i.e. up to (1/1000)°
Rocking curve measurement using Theta-scan method
Determination of lattice parameters [(Si, Ge) solid solutions]
High-resolution diffraction (reciprocal-lattice mapping)
Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.
Processing large single crystals for wafer production is a key to success in the semiconductor industry. During sawing and grinding, the control of the orientation ensures a good product quality.
Requiring a convenient and fast XRD method for crystal orientation measurements, the industry is the primary application field for the Omega Scan.
Components built from NLO materials have to fulfill high quality standards at the crystal surface and within the bulk material. The surface quality measurement can be combined with XRD orientation determination in one machine.
In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...
In most cases the crystal orientation measurement is a precondition for other processing or measurement steps. The details and peciliarities of each method are not of interest for the most users; they want a reliable result to decide how to go on with their work. Thus having a clear interface and...