MDPmap

Mono- and Multi-crystalline wafer lifetime measurement device

for sophisticated material research & development

Omega/Theta

Ultra-fast crystal orientation measurement using Omega-scan method

PIDcon bifacial

for quality control of bifacial PERC/PERC+ solar cells and more

MDpicts

for contactless and destruction free temperature dependent measurement of minority carrier lifetime and electrical characterization of bulk and interface trap levels of semiconductors

MDPmap

Omega/Theta

PIDcon bifacial

MDpicts

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