CN

XRD for large crystals, ingots & boules

Samples with a wide variety of geometry & size

Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.

Marking and measuring of in-plane directions

In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation....

Crystal quality

The quality of a crystal is not exactly measurable. However we can compare measurements on several physical properties to standards for clean and ordered crystals. With XRD, the relevant property is called the Rocking Curve of a reflection.

Non-Linear Optical materials (NLO): Crystal quality and orientation determination

Components built from NLO materials have to fulfill high quality standards at the crystal surface and within the bulk material. The surface quality measurement can be combined with XRD orientation determination in one machine.

MPD series / µPCD

µPCD/MDP (QSS)

PID series

PID

XRD series / X-ray diffraction

X-ray diffraction

Branches

Projects

Projects

Company

Company