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Bar Alignment, Wafer Analysis & Blank Sorting using X-Ray Diffractometer

  • Measurement speed as low as 2 s (AT quartz)

  • Highest precision ≤ 10 arcsec standard deviation

  • Spatial resolution 1 mm ± 0.1 mm

Features & Benefits

  • Determination of orientation inclination relative to the sample surface

  • Automatic display of angular components (Theta & Phi) including standard deviation

  • German engineering: robust and modular design

  • Available for different cuts: AC, SC, IT, TF and more

  • Easy-to-use software suite with multiple user levels and automatic display, recording & reporting of measurement data

  • Automation: Customized sample handling systems for different size wafers or blanks, including robot, pick & place, vibratory feeder



Manufacturing Process from Bar to Blank


Options

  • MES interface for Industry

  • Mapping (wafers)

  • Stereographical projection and more

Technical Data

  • X-ray tube: 1.5 kW, Cu anode

  • Power supply: 200 – 230 V, 16 A, single phase

We’ve built XRD systems for the quartz industry for decades – some run 24/7 after 20+ years. That stability delivers consistent, traceable results every shift.

Dr. Ing. Hans-Arthur Bradaczek
Head of X-ray Technology

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com