Bar Alignment, Wafer Analysis & Blank Sorting using X-Ray Diffractometer
Measurement speed as low as 2 s (AT quartz)
Highest precision ≤ 10 arcsec standard deviation
Spatial resolution 1 mm ± 0.1 mm
Features & Benefits
The Quartz XRD series
Manufacturing Process from Bar to Blank


We’ve built XRD systems for the quartz industry for decades – some run 24/7 after 20+ years. That stability delivers consistent, traceable results every shift.
Dr. Ing. Hans-Arthur Bradaczek
Head of X-ray Technology




