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Revolutionize your ingot post glueing preparation: Automated, precise and modular

  • Ultra-fast hybrid X-ray optical metrology with proprietary algorithm

  • Robot driven operations with modular metrology and tooling

  • Advanced factory connectivity and service provisions

Materials

The Ingot XRD SiC delivers high-throughput and precision for the efficient production of advanced SiC wafers.

SiC GaN AIN and more

Features & Benefits

Unmatched
Quality

with hybrid metrology

0.005˚

On-axis precision

Flexible

Loading and communication options

Diameter
100–300

mm

Diameter
100–300

mm

Interested? Our experts are happy to assist you.

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Contact us now!

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com