DDCOM

Ultra-fast, bottom surface measuring crystal orientation in a compact package

Exclusively through Malvern Panalytical

Product Sheet

Materials

With DDCOM, a wide variety of materials can be precisely analyzed. Thanks to their flexibility and performance, our systems meet even the most demanding requirements.

Ag Al₂O₃ (sapphire) AlSb Au CdTe GaAs GaN GaP GaPO₄ GaSb Ge InAs InP InSb La₃Ga₅SiO₁₄ LaTiO₃ LiF LiNbO₃ Mg₂SiO₄ MgAl₂O₄ MgF₂ MgO NdGaO₃ Ni PbS PbTe Pt Si SiC 2H SiC 4H SiC 6H SiC 15R SiC₃C SiO₂ (quartz) SnTe SrLaAlO₄ SrTiO₃ TiO₂ ZnO ZnTe and more

Features & Benefits

Ultra-fast Omega-scan approach

200 times faster than Theta-scan method
Automatic evaluation of the complete lattice orientation in 3D
Determination of entire crystal orientation within 5 seconds

Efficient workflows for quality control

For standard research and industrial workflows
Azimuthal setting and marking of crystal orientation
Preprogrammed cubic crystal parameters
State-of-the-art and convenient software
High precision, i.e up to (1/100)°

Compact, user friendly and cost effective

Easily movable and lightweight desktop design
Convenient sample handling and easy to operate
Low energy consumption and operating costs due to air cooled X-ray tube (no water cooling required)

Control of cutting, grinding and lapping

Complete lattice orientation of single crystals
Suitable for a unique variety of materials in a large range of size and weight, such as: Wafers from 2-12” and Ingots up to 20kg

Highlights

Determination of the complete lattice orientation of single crystals
Ultra-fast crystal orientation measurement using the Omega-scan method
Determination of the arbitrary unknown orientation of cubic crystals
Designed especially for azimuthal setting and marking of lattice directions
Air cooled X-ray tube, no water cooling required
Appropriate for research and production quality control

Omega-scan method: All desired crystal orientation parameters are captured in one rotation within 5 seconds.

Applications

DDCOM – Exclusively through Malvern Panalytical

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Technical specifications

X-ray source	30 W air-cooled X-ray tube, Cu anode
Detectors	Two scintillation counters
Sample holder	Precise turntable, setting accuracy 0.01°, tools for defined sample positioning and marking
Dimensions	600 mm × 600 mm × 850 mm
Weight	80 kg
Power supply	100-230 V, 100 W, single phase
Room temperature	≤ 30° C