Products

Innovative Metrology and Automation Solutions

We engineer advanced metrology and automation solutions that redefine industry standards. Our precision-driven systems empower research and production environments across various high-tech industries, ensuring accuracy, efficiency, and reliability.

$Advanced X-Ray diffractometers$

XRD series Advanced X-Ray diffractometers

Devices for crystal orientation, sample alignment & quality control

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Resistivity Mapping

RES series Resistivity Mapping

Accurate material analysis for semiconductor quality control

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Microwave Detected Photoconductivity

MDP series Microwave Detected Photoconductivity

Contactless mapping of key electrical semiconductor parameters

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Surface Photovoltage Spectroscopy

SPS/SPV series Surface Photovoltage Spectroscopy

Contactless characterization of key electro-optical material parameters

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Double Prism Monochromator

DPM series Double Prism Monochromator

Unlock the future of spectral analysis

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Potential Induced Degradation

PID series Potential Induced Degradation

Advanced Solutions for PID Detection and Quality Control in Solar Cells & Module

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Luminescence Dating and Dosimetry

TL/OSL series Luminescence Dating and Dosimetry

Advanced luminescence systems for geology, archaeology, and radiation dosimetry

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Radiation Monitoring System

RMS series Radiation Monitoring System

Protecting people, workspaces, and the environment with precision

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Raman Sensor

Ramses series Raman Sensor

Fully automated, high sensitive for polymer and semiconductor sorting

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Each of our product lines is designed to meet the highest industry standards, providing unparalleled performance for researchers and manufacturers worldwide.

Dr. Kay Dornich
Chief Executive Officer