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Enables advanced material research for thin layers and surfaces: destruction free, flexible and fast

  • Highly sensitive due to an advanced electronic detection system

  • Customized lasers and optics for up to 4 different wavelengths

  • Automatic temperature dependent measurement and/or annealing steps for up to 25 samples

Materials

The SPSmap heat has a versatile range of exciting lasers and enables the electrical characterization of almost all semiconductors

Perovskite Si SiC Ge GaAs InP Ga₂O₃ Diamond

Features & Benefits

355…1550 nm

Available wavelengths

0.1 mm

Spatial resolution

10 ns

Time resolution

Up to
25 samples

Auto. measurement and heating sequence

Up to
25 samples

Auto. measurement and heating sequence

  • Sensitivity: sub-mV sensitivity and more than 3 orders of magnitude signal height resolution

  • Measurement speed: < 5 minutes for a 150 mm wafer with 1 mm resolution

  • Time resolution: 10 ns up to 100 ms

  • Automation: Up to 25 samples can be automatically mapped

  • Temp dependent measurements: fully automated temperature dependent measurements or annealing treatments up to 100 °C

Discover the Key Advantages in 30 Seconds

Applications


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Technical specifications

sample sizewafers or thin slabs up to 25 mm thickness, 5 x 5 mm2 to 160 x 160 mm, square wafers
excitationselect up to four different wavelengths from 337 nm up to 1550 nm (default 980 nm)
materialPerovskite or any photoactive material (contact us for consultation on your material)
measureabletime-resolved and temperature dependent surface photovoltage measurements
dimensions750 x 835 x 660 mm
weightapp. 120 kg
power100 - 250V, 50/60 Hz, 5 A
resolution100 µm

Accessories & Options

Our devices offer versatile configuration options to meet specific requirements effectively. Each model can be customized to ensure maximum flexibility and efficiency.

Contact for more information

  • Wide range of laser light sources from 337 nm up to 1550 nm

  • Integrated heating stage (20-250 °C)

  • Spot size variation

  • Reference wafer (Si)
     

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com