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Materials

Sophisticated Material Research & DevelopmentFew examples for research applications,
  • Iron concentration determination

  • Trap concentration determination

  • Boron oxygen determination

  • Injection dependent measurements and more

Si SiC compound semiconductor Ge GaAs CdTe InP ZnS Perovskite oxides wide bandgap materials epitaxial layers and more

Features & Benefits

Throughput
>240

bricks/day

Speed
> 99%

Repeatability

1 mm

cutting criteria for 156x156x400 m brick

quality

monitoring

quality

monitoring

  • Contactless and destruction free lifetime imaging (μPCD/MDP (QSS)), photoconductivity, resistivity and p/n check according to semi standard SEMI PV9-1110

  • Wafer cutting, Furnace monitoring, Material optimization and more

  • Best throughput: >240 bricks/day or >720 wafers/day

  • Measurement speed: <4 minutes for a 156 x 156 x 400 mm standard brick

  • Yield improvement: 1 mm cutting criteria for a 156 x 156 x 400 mm standard brick

  • Quality control: designed for quality monitoring of processes and materials like mono or multi-crystalline silicon

  • Contamination determination: metal (Fe) contaminations originated in crucibles and equipment

  • Reliability: modular and rugged industrial instrument for higher reliability and uptime > 99%

  • Repeatability: > 99%

  • Resistivity: resistivity mapping without frequent calibration

Facts

  • completely contactless destruction free electrical semiconductor characterisation

  • special “underneath the surface” lifetime measurement technique

  • advanced sensitivity for visualisation of so far invisible defects

  • automated cut criteria definition

  • spacial resolved p/n conduction type transformation detection

Applications


Interested? Our experts are happy to assist you.

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Accessories & Options

  • Spot size variation

  • Resistivity measurement (bricks/wafers)

  • Background/Bias light

  • Reflection measurement (MDP)

  • LBIC

  • BiasMDP

  • LBIC for solar cells

  • LBIC, BiasMDP measurement stage with contacts

  • Reference wafer

  • Resistivity calibration set (bricks/wafers)

  • Internal iron mapping of Si

  • P/N detection

  • Bar code reader

  • Wide range of lasers

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com