MDPpro

With MDPmap and MDPingot it is possible to measure the resistivity of wafers or bricks with a high accuracy and a resolution of 1 mm via eddy current measurements. The Eddy current sensor setup…

The proceeding is based on the measurement of the local short circuit current Isc in the cell, which is produced through appropriate excitation. For the measurement the solar cell is contacted…

Since several years, the microelectronic industry is planning to enlarge the wafer size from 300 mm (12 inch) to 450 mm (18 inch) diameter, in order to gain more yield. The technology for the…

With the MDPingot and MDPmap series it is possible to measure the iron concentration in bricks and wafers fully automated and with a very high resolution. Lifetime measurements before and after…

In the PV industry sometimes also low quality material with a high phosphorous concentration is used. Phosphor has a segregation coefficient of 0.35 and is therefore segregating in the top of the…

Lifetime measurements before and after chromium boron pair dissociation is a widely used method for chromium determination in silicon wafers. In boron doped silicon with a high doping…

The boron-oxygen complexes can be activated by irradiating the sample with light and deactivated by heating the sample at 200 °C for several minutes. This can be used similar to the iron…

With the MDPmap and MDPingot it is possible to measure the photoconductivity as well as the minority carrier lifetime with one measurement and fully automated in a wide injection range. A clever…

With MDPmap it is possible to measure not only injection dependent lifetime curves but also photoconductivity curves over a very wide range of injection.   In the MDPmap and MDPingot up to 4…

With the MDPinline ingot it is possible to measure all 4 sides of a brick in under 1 min per side with 1 mm resolution. At the same time a spatial resolved measurement of conduction type changes…

Non-destructive measurements of minority carrier lifetime are well established and widely used for process control and characterization of defects in crystalline silicon. With our tool MDPinline…

The measured or effective lifetime consists of the bulk lifetime and the surface lifetime, via:   \(\cfrac{1}{\tau_{eff}} = \cfrac{1}{\tau_{bulk}} + \cfrac{1}{\tau_{surface}}\)   That‘s why the…

In this case not the lifetime, but the photoconductivity or signal height is the most sensitive parameter for detecting inhomogeneity in implantations. It depends strongly on the resistivity and…

With MDP it is possible to measure the lifetime of minority carriers and the photoconductivity in epitaxial layers as fast and exactly as possible with a high resolution. The measurement of…