MDP series

µPCD/MDP(QSS)

Visualization of semiconductor quality is achieved by widely advanced microwave techniques. Which allow for a mapping of key electrical semiconductor parameters contactless and with production speed. Measurement of parameters like minority carrier lifetime, photoconductivity, resistivity and defect information can be mapped by a so far unsurpassed combination of spatial resolution, sensitivity and measurement speed. This approach enables a wide field of established and new applications for semiconductor production and research.

Seamlessly transition from lab research to full-scale production with our advanced “Lab to Fab” electrical characterization equipment.

Dr. Nadine Schüler
Head of Research & Development

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sales@freiberginstruments.com