Microwave Detected Photoconductivity

Unlock material insights with µPCD/MDP(QSS) – High-resolution, contactless measurement solutions for research and production: The MDP series

Visualization of semiconductor quality is achieved by widely advanced microwave techniques. Which allow for a mapping of key electrical semiconductor parameters contactless and with production speed.

Measurement of parameters like minority carrier lifetime, photoconductivity, resistivity and defect information can be mapped by a so far unsurpassed combination of spatial resolution, sensitivity and measurement speed.

From OEM modules to turnkey systems, the MDP series adapts to your workflow – empowering your next innovation in microelectronics and photovoltaics.