Microwave Detected Photoconductivity

Versatile solutions, from OEM units to flexible research and production tools, focused on specific tasks

MDP series

µPCD/MDP(QSS)

Visualization of semiconductor quality is achieved by widely advanced microwave techniques. Which allow for a mapping of key electrical semiconductor parameters contactless and with production speed. Measurement of parameters like minority carrier lifetime, photoconductivity, resistivity and defect information can be mapped by a so far unsurpassed combination of spatial resolution, sensitivity and measurement speed. This approach enables a wide field of established and new applications for semiconductor production and research.

MDPmap

MDP series MDPmap

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MDPspot

MDP series MDPspot

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RESmap

MDP series RESmap

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MDPlinescan

MDP series MDPlinescan

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MDPpro

MDP series MDPpro

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MDPpro 850+

MDP series MDPpro 850+

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MDpicts

MDP series MDpicts

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MDpicts pro

MDP series MDpicts pro

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HTpicts

MDP series HTpicts

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Seamlessly transition from lab research to full-scale production with our advanced “Lab to Fab” electrical characterization equipment.

Dr. Nadine Schüler
Head of Research & Development

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com