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XRD OEM

Fully automated in-line orientation and handling of ingots, boules, and pucks

Exclusively through Malvern Panalytical

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Materials

With XRD-OEM, a wide variety of materials can be precisely analyzed. Thanks to their flexibility and performance, our systems meet even the most demanding requirements.

Si SiC GaAs and more

Features & Benefits

Ingots up to
450 mm

diameter

flat/notch

detection

large ingots
Preset

prior to sawing/grinding

Ultra-fast

crystal orientation measurement

Ultra-fast

crystal orientation measurement

  • Ready for integration for any automation or processing system

  • Designed for harsh environments (grinding, sawing)

  • Compact, standard industrial interfaces

  • Independent orientation measurement

  • Measurements on flat surface or circumferences

  • Optical notch detection

Applications

Orientation of silicon ingots:

  • detection of flat and notch position prior to grinding

  • diameter up to 8''

  • length up to 40 cm

XRD-OEM – Exclusively through Malvern Panalytical

This product is distributed by our trusted partner.

Contact for demo

Technologies

Omega-scan

Ultra-Fast Orientation Measurement for Single Crystals

Learn more

Theta-scan

Precision X-ray Method for Single Crystal Orientation

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Software

XRDStudio

Multiple Operating ModesOperator Mode: Designed for fixed measurement parameters, ensuring a safe and streamlined workflow. Administrator Mode: Allows for the creation and modification of…

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XRD-OEM – Exclusively through Malvern Panalytical

This product is distributed by our trusted partner.

Contact for demo