Materials
For HJT, HIT, TOPcon, bifacial PERC, PERC+ solar cells and more.
Features & Benefits
Range of lifetimes: 20 ns to 100 ms (for samples > 0.3 Ohm cm)
SEMI standard: PV9-1110
Measurement speed: < 30 sec for linescan
< 5 min for complete mapping
Simultaneous measurement of: lifetime μPCD/MDP (QSS) and resistivity
Automatic geometric recognition: G12, M10 bricks and wafers
Applications
Technical specifications
Material | monocrystalline silicon |
---|---|
Ingot size | between 125 x 125 to 210 x 210 mm², brick length 850 mm or longer |
Wafer Size | up to 300 ¬mm diameter |
Resistivity range | 0.5 – 5 Ohm cm. Other ranges on request |
Conduction type | p, n |
Measurable properties | lifetime - μPCD/MDP (QSS), photoconductivity, resistivity and more |
Default excitation | lR laser diode (980 nm, max. 500 mW) and IR laser diode (905 nm, max. 9000 mW). Other wavelengths are available on request |
PC workstation | Windows 11 or latest, .NET Framework update, 2 Ethernet ports |
Power requirements | 100 – 250 V AC, 6 A |
Dimensions (W × H × D) | 2560 × 1910 × 1440 mm |
Weight | approx. 200 kg |
Certification | manufactured under ISO 9001 guidelines, CE conform |

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Technologies
Accessories & Options
Our devices offer versatile configuration options to meet specific requirements effectively. Each model can be customized to ensure maximum flexibility and efficiency.
Spot size variation
Resistivity measurement (bricks/wafers)
Background/Bias light
Refl ection measurement (MDP)
LBIC
Internal iron mapping of p-doped Si
P/N detection
Bar code reader
Automatic geometric recognition
Wide range of lasers
Get in touch
Do not hesitate to contact us – we are available to assist you with any inquiries or requests.
Use our inquiry tool or reach out via email:
sales@freiberginstruments.com