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Materials

For HJT, HIT, TOPcon, bifacial PERC, PERC+ solar cells and more.

Si Perovskite and more

Features & Benefits

  • Range of lifetimes: 20 ns to 100 ms (for samples > 0.3 Ohm cm)

  • SEMI standard: PV9-1110

  • Measurement speed: < 30 sec for linescan
    < 5 min for complete mapping

  • Simultaneous measurement of: lifetime μPCD/MDP (QSS) and resistivity

  • Automatic geometric recognition: G12, M10 bricks and wafers

Applications


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Technical specifications

Materialmonocrystalline silicon
Ingot sizebetween 125 x 125 to 210 x 210 mm²,
brick length 850 mm or longer
Wafer Sizeup to 300 ¬mm diameter
Resistivity range0.5 – 5 Ohm cm. Other ranges on request
Conduction typep, n
Measurable propertieslifetime - μPCD/MDP (QSS), photoconductivity, resistivity and more
Default excitationlR laser diode (980 nm, max. 500 mW) and IR laser diode (905 nm, max. 9000 mW).
Other wavelengths are available on request
PC workstationWindows 11 or latest, .NET Framework update, 2 Ethernet ports
Power requirements100 – 250 V AC, 6 A
Dimensions (W × H × D)2560 × 1910 × 1440 mm
Weightapprox. 200 kg
Certificationmanufactured under ISO 9001 guidelines, CE conform

Technologies


Accessories & Options

Our devices offer versatile configuration options to meet specific requirements effectively. Each model can be customized to ensure maximum flexibility and efficiency.

Contact for more information

  • Spot size variation

  • Resistivity measurement (bricks/wafers)

  • Background/Bias light

  • Refl ection measurement (MDP)

  • LBIC

  • Internal iron mapping of p-doped Si

  • P/N detection

  • Bar code reader

  • Automatic geometric recognition

  • Wide range of lasers

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com