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Materials

With Wafer XRD, a wide variety of materials can be precisely analyzed. Thanks to their flexibility and performance, our systems meet even the most demanding requirements.

Si SiC Quartz GaN GaAs AIN InP Al₂O₃ (sapphire) and more

Features & Benefits

  • Fully automated wafer handling and sorting system (eg: cassette to cassette)

  • Crystal orientation and resistivity measurements

  • Optical determination of geometric features (notch position, notch deep, notch opening angle, diameter, flat position and flat length) of wafers

  • Distance measurement for unpolished wafers and mirroring surfaces

  • MES and/or SECS/GEM interfaces

Wafer XRD – Exclusively through Malvern Panalytical

This product is distributed by our trusted partner.

Contact for demo

Wafer XRD – Exclusively through Malvern Panalytical

This product is distributed by our trusted partner.

Contact for demo