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Enables advanced material research for thin layers and surfaces: destruction free, flexible and fast

  • Highly sensitive due to an advanced electronic detection system

  • Customized lasers and optics for up to 4 different wavelengths

  • Investigation of charge separation processes and electronic transitions (defects)

Materials

Si SiC Ge GaAs Ga₂O₃ InP Diamond and more

Features & Benefits

355–1550 nm

Available wavelengths

10 ns

Time resolution

0.1 mm

Spatial resolution

< 5 min

Throughput for 8’’ wafer

< 5 min

Throughput for 8’’ wafer

  • Sensitivity: sub-mV sensitivity and more than 3 orders of magnitude signal height resolution

  • Measurement speed: < 5 minutes for a 150 mm wafer with 1 mm resolution

  • Time resolution: 10 ns up to 100 ms

  • Optical head: Up to 4 light sources integrated into the optical head or fixture for mounting of external lasers – build-in suppression of stray light

  • Reliability: modular and compact bench top instrument for high reliability and uptime > 99%

Flexible Mapping Tool for R&D and Production Monitoring

The HR-SPSmap product platform builds on the proven foundation of the widely acclaimed MDPmap series. This compact, benchtop, contactless electrical characterization tool is specifically designed for offline production control and research and development applications. It measures surface photovoltage (SPV) across a wide injection range, accommodating both steady-state and short-pulse excitation. With automated sample recognition and parameter setup, it effortlessly adapts to a diverse range of samples, including epitaxial layers and wafers at various stages of processing, from as-grown material to fully fabricated devices.

Exceptional Flexibility and Advanced Features

One of the standout advantages of the HR-SPSmap is its exceptional flexibility. Equipped with fixed-energy excitation sources, the system supports the integration of up to four lasers within the measurement head. This capability facilitates injection-level-dependent SPV measurements across a broad range, from very low to high injection levels, and enables depth profiling using different laser wavelengths. The system also includes a bias light feature for enhanced measurement options.

In addition, the HR-SPSmap supports custom calculations and mapping configurations, along with the ability to export primary data for detailed external analysis. For standard metrology tasks, the platform offers a predefined recipe system, allowing routine measurements to be completed with a single button press.

Unlock Precision and Adaptability

With its advanced capabilities and user-friendly design, the HR-SPS is the ideal solution for researchers and production teams seeking high-precision surface photovoltage measurements. Whether for R&D innovation or reliable production monitoring, this platform redefines flexibility and efficiency in electrical characterization.

Applications


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Technical specifications

sample sizepowder samples up to 300 mm diameter
excitationselect up to four different wavelengths from 337 nm up to 1550 nm (default 980 nm)
materialany photoactive material (contact us for consultation on your material)
measureabletime-resolved surface photovoltage measurements
dimensions680 x 380 x 450 mm, weight: app. 65 kg
power100 - 250V, 50/60 Hz, 5 A
resolution100 µm

Accessories & Options

Our devices offer versatile configuration options to meet specific requirements effectively. Each model can be customized to ensure maximum flexibility and efficiency.

Contact for more information

  • Wide range of laser light sources from 337 nm up to 1550 nm

  • Integrated heating stage (20-250°C)

  • Spot size variation

  • Bias light

  • Resistivity measurement (wafers)

  • Reference wafer (Si)

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com