Assessing Crystal Quality via XRD Reflection Analysis
Crystal quality cannot be directly measured, but several physical properties can be assessed and compared to standards for pure, homogeneous crystals. One such property is the half-width of an X-ray diffraction (XRD) reflection.
The regularity of the crystalline lattice defines its quality. Imperfections such as defects, dislocations, and contaminants are inherent in every lattice. Additional discontinuities, like grain boundaries and cracks, also exist. These imperfections introduce local strain within the surrounding lattice, which can be detected by recording the rocking curve of an X-ray reflection.
By analyzing the geometric properties of the incident beam and the resulting rocking curve half-width, the surface quality of the crystal can be effectively characterized.
Related Technologies: Omega-scan
