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Metrology solutions for the photovoltaic industry

Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last years the photovoltaic industry showed the highest growth rate of all renewable energy industries

Facing the challenges of the photovoltaic industry with state-of-the-art metrology solutions

Recently the overflow of global competitors and a fast growing global production capacity has led to a dramatically decrease of system prices and put pressure especially on solar cell and module producers. Hence it becomes more and more important to convince customers by a high quality standard and to further reduce prices. Freiberg Instruments metrology solutions are ideal to help increasing the yield and the quality of the produced solar cells. With them the material quality can be assessed right at the beginning of the production chain and be measured after every production step, from the brick to the finished solar cell.

  • Improvement of material yield at bricks determine pn-changes and exact cutting criteria for discard of low quality parts of the brick

  • Measurement of bulk information at bricks measures with a long light pulse for steady state - the generated carriers can diffuse into the bulk, so that also bulk information can be gained

  • High measurement speed full wafer map with a resolution of better than 2 mm takes under one second, full map of a brick face with a resolution of 1 mm takes under 1 min

  • Very good measurement capability repeatability of below 1% for lifetime measurements and below 3% for resistivity measurements

  • High sensitivity unsurpassed sensitivity due to our advanced microwave detection system, possible to measure thin films or solar cells as well as wafers and bricks

  • Mono-like silicon new twist at PV crystal solidification technology leads to mono like silicon -  improved minority carrier lifetime allows for efficiency gain of up to 2.5% for solar cells

Tools for Photovoltaic Industry

MDPmap

Mono- and Multi-crystalline wafer lifetime measurement device

MDPpro

Mono- and Multi-crystalline wafer and brick lifetime measurement device

MDPpro850+

for production and quality control of monocrystalline Si ingots,bricks and wafers

MDPspot

Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different preparation stages, without built-in automatization. Optional hand operated z-axis for thicker samples up to 156 mm bricks....

Applications for Photovoltaic Industry

EVA evaluation

The aim of the PIDcon is to enable the producers to test not only the solar cells, but the encapsulation materials as well. The EVA foil has a crucial influence on the PID susceptibility and needs to be investigated.

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Glass evaluation

The glass of a module and especially its resistivity is crucial for the PID susceptibility of a module. Hence the glass needs to be investigated separately from the influence of the solar cell and the EVA.

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Injection dependent measurements

The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about the dominant recombination center as well as trapping center can be deduced.

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Mini-module classification

The bench top system PIDcon enables the routine quality control of mini modules as a fast and low cost test of the PID susceptibility, where no climate chamber or other expansive tools are needed.

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Production monitoring

Potential induced degradation (PID) is a serious reliability problem in PV power plants. Hence it is important to investigate its products on their PID susceptibility. The aim of the PIDcon is to enable the producers to test their products as early as possible in the production chain as well as...

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Solar cell classification

The PIDcon allows routine quality control of the PID susceptibility of solar cells in a short time and independent from the influence of EVA and glass.

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Trap concentration determination

Trapping centers are very important, in order to understand the behavior of carriers in the material and can also have an effect on solar cells. Hence it is desirable to measure the trap density and the activation energy of these trap centers with a high resolution.

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