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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last years the photovoltaic industry showed the highest growth rate of all renewable energy industries
Recently the overflow of global competitors and a fast growing global production capacity has led to a dramatically decrease of system prices and put pressure especially on solar cell and module producers. Hence it becomes more and more important to convince customers by a high quality standard and to further reduce prices. Freiberg Instruments metrology solutions are ideal to help increasing the yield and the quality of the produced solar cells. With them the material quality can be assessed right at the beginning of the production chain and be measured after every production step, from the brick to the finished solar cell.
Improvement of material yield at bricks determine pn-changes and exact cutting criteria for discard of low quality parts of the brick
Measurement of bulk information at bricks measures with a long light pulse for steady state - the generated carriers can diffuse into the bulk, so that also bulk information can be gained
High measurement speed full wafer map with a resolution of better than 2 mm takes under one second, full map of a brick face with a resolution of 1 mm takes under 1 min
Very good measurement capability repeatability of below 1% for lifetime measurements and below 3% for resistivity measurements
High sensitivity unsurpassed sensitivity due to our advanced microwave detection system, possible to measure thin films or solar cells as well as wafers and bricks
Mono-like silicon new twist at PV crystal solidification technology leads to mono like silicon - improved minority carrier lifetime allows for efficiency gain of up to 2.5% for solar cells
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput. Total measurement times of less than one minute at 1 mm resolution for one face of the brick. Bricks are automatically...
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different preparation stages, without built-in automatization. Optional hand operated z-axis for thicker samples up to 156 mm bricks....
The aim of the PIDcon is to enable the producers to test not only the solar cells, but the encapsulation materials as well. The EVA foil has a crucial influence on the PID susceptibility and needs to be investigated.
The glass of a module and especially its resistivity is crucial for the PID susceptibility of a module. Hence the glass needs to be investigated separately from the influence of the solar cell and the EVA.
The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about the dominant recombination center as well as trapping center can be deduced.
The bench top system PIDcon enables the routine quality control of mini modules as a fast and low cost test of the PID susceptibility, where no climate chamber or other expansive tools are needed.
Potential induced degradation (PID) is a serious reliability problem in PV power plants. Hence it is important to investigate its products on their PID susceptibility. The aim of the PIDcon is to enable the producers to test their products as early as possible in the production chain as well as...
The PIDcon allows routine quality control of the PID susceptibility of solar cells in a short time and independent from the influence of EVA and glass.
Trapping centers are very important, in order to understand the behavior of carriers in the material and can also have an effect on solar cells. Hence it is desirable to measure the trap density and the activation energy of these trap centers with a high resolution.