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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
for quality control of bifacial PERC/PERC+ solar cells, c-Si solar cells, mini modules and more
Obstacle The change to a light capping rear side of the cells, was found to make bifacial PERC cells and modules sensitive to new types of PID at the rear side, namely PID of the de-polarization type (PID-p) and a corrosive PID mechanism (PID-c).
Solution In order to test cells for these kinds of PID, the PIDcon bifacial was developed. It is stressing the complete cell with temperature, illumination and high voltage, which can be polarized in both directions. By measuring the IV curve under illumination the PID sensitivity can be determined.
PID detection at cell level
Research, Production & Quality Control of PERC, AL-BSF, PERC+, bifacial PERC, PERT, PERL and IBC solar cells
For more information, please visit www.pidcon.com
Measurements of cells
Test duration: 4 hours (typical)
Ability to measure PERC, AL-BSF, PERC+, bifacial PERC, PERT, PERL and IBC solar cells
Voltage: ± 1.5 kV
No climate chamber necessary
Easy to use bench top device
For PERC, AL-BSF, IBC, PERC+, bifacial PERC p- and n-type