Mini-module Classification

The PIDcon benchtop system offers fast, cost-effective routine quality control for mini-modules' PID susceptibility, without the need for a climate chamber

Skip breadcrumb navigation

Potential Induced Degradation (PID) is a critical reliability issue in PV power plants, making it essential to assess products for their susceptibility to PID. The PIDcon system helps manufacturers test products earlier in the production chain, such as mini-modules. The PID in question refers to the shunting of solar cells caused by high-voltage stress-induced leakage currents (PID-s).

Mini-modules are contacted at two points, with a contact check ensuring proper connection.

The PIDStudio software allows users to define pass/fail criteria and also provides recommended settings based on IEC standards and the expertise of Fraunhofer CSP scientists.

Matching Products

PIDcon bifacial

PID series PIDcon bifacial

Quality Control Solution for Bifacial PERC/PERC+, HIT, Topcon, c-Si Solar Cells, Mini Modules, and More

Learn more

Get in touch

Do not hesitate to contact us – we are available to assist you with any inquiries or requests.

Use our inquiry tool or reach out via email:
sales@freiberginstruments.com