Since 2010 the potential induced degradation is known to be one of the main causes for module failures. With the new technology developed by the Fraunhofer CSP and now commercially available as the benchtop tool PIDcon by Freiberg Instruments solar cells and mini modules can be tested for their PID susceptibility.
Learn more about the reasons for PID and how the susceptibility of solar cells, mini modules and encapsulation materials can be investigated.