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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument with a variable energy excitation source...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Bar Alignment | Wafer Analysis | Blank Sorting
AT | SC | IT | TF | X | Y | Z
Fully automated quartz bar aligning machine
Fully automated uptake and alignment of quartz bars
Automated gluing on adapter plate
Alignment precision: ± 0.5° (AT & TF)
Fully automated quartz wafer analysingmachine
Round, rectangular & square
4 x 4 mm up to 80 x 80 mm (manual sample handling)
20 x 20 mm up to 80 x 80 mm (automatic sample handling)
Mapping option for spatial quality check
Modular design allows future automation upgrade
Standard sample holders for input/output: cassettes or stacks
Sorting function available
Throughput: up to 350 wafers/h at standard sorting accuracy
4 x 4 mm up to 12 x 12 mm (manual sample handling)
1.5 x 1.5 mm up to 3.0 x 6.0 mm (automation option I)
4.0 x 4.0 mm up to 9.0 x 9.0 mm (automation option II)
Sorting into quality groups: ± 7.5 arcsec (minimum)
Throughput: up to 1000 blanks/h at standard sorting accuracy
Freiberg Instruments follows in a long tradition of XRD devices for the quartz industry. Some of these systems, previously manufactured by EFG, are still running 24 h after 20 years of operation. We offer ongoing service for these machines:
contact person: Dr. Hans-Arthur Bradaczek