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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument with a variable energy excitation source...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic industry.
R & D involves a number of challenges as the high costs, long timescales and often uncertain outcomes. Especially for R & D in the semiconductor industry the time factor is essential, since the intensive rivalry leads to faster and faster developments of new products. Freiberg Instruments equipement is ideal for research purposes and even customized solutions are possible.
trap concentration determination ability to measure injection dependent photoconductivity and lifetime simultaneously to determine the trap density and activation energy
pn-detection automatically detect a change in the conduction type from p to n with a resolution of 1 mm
Lifetime simulations numerical tool based on a rate equation system, which is solved for all possible transitions between defect levels and bands
Simulations of carrier profiles simulation tool for the simulation of carrier profiles for measurements at thick samples like ingots
3D-mapping of crystalline turbine blades made from NI-superalloys
The quality of a crystal is not exactly measurable. However we can compare measurements on several physical properties to standards for clean and ordered crystals. With XRD, the relevant property is called the Rocking Curve of a reflection.
The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about the dominant recombination center as well as trapping center can be deduced.
In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...
Mapping of crystalline surfaces for the determination of the orientation distribution
Rocking curve measurements are sensitive to defects and strain fields within the crystal lattice. Combining this technique with a mapping stage allows to scan a crystal surface and determine faulty areas. In lattice matched thin films, rocking curves can also be used to study layer thickness,...
Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.