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Metrology solutions for Research and Development

Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic industry. 

Facing the challenges in research and development with fast and precise metrology equipment

R & D involves a number of challenges as the high costs, long timescales and often uncertain outcomes. Especially for R & D in the semiconductor industry the time factor is essential, since the intensive rivalry leads to faster and faster developments of new products. Freiberg Instruments equipement is ideal for research purposes and even customized solutions are possible.

  • trap concentration determination ability to measure injection dependent photoconductivity and lifetime simultaneously to determine the trap density and activation energy

  • pn-detection automatically detect a change in the conduction type from p to n with a resolution of 1 mm

  • Lifetime simulations numerical tool based on a rate equation system, which is solved for all possible transitions between defect levels and bands

  • Simulations of carrier profiles simulation tool for the simulation of carrier profiles for measurements at thick samples like ingots

Tools for Research and Development

MDPmap

Mono- and Multi-crystalline wafer lifetime measurement device

Applications for Research and Development

3D Mapping of crystalline turbine blades

3D-mapping of crystalline turbine blades made from NI-superalloys

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Crystal quality

The quality of a crystal is not exactly measurable. However we can compare measurements on several physical properties to standards for clean and ordered crystals. With XRD, the relevant property is called the Rocking Curve of a reflection.

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Injection dependent measurements

The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about the dominant recombination center as well as trapping center can be deduced.

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Marking and measuring of in-plane directions

In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...

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Orientation mapping of crystalline surfaces

Mapping of crystalline surfaces for the determination of the orientation distribution

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Samples with a wide variety of geometry & size

Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.

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