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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument with a variable energy excitation source...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
1961 -EFG GmbH was established by the X-ray Ing. Arthur Bradaczek and his son Hans Bradaczek.
1969 - World's first X-ray detecting and counting unit on the basis of integrated circuits, named COUNTIX 130 was developed and introduced.
1989 - Development of Omega-Scan Method
- BOSCH requests an Orientation Measurement System for round Quartz Blanks
- Yield rise from 50% to 95% at the oscillator production
2005 - Transferring the Omega to other Materials like Sapphire, SiC, GaN, GaAS, Si, Ni-super alloys
2010 - Introduction of Desktop X-ray Diffractometer for Crystal Orientation Measurement (DDCOM)
- Approximately 150 Quartz sorting systems were sold world wide
2015 - The X-ray technology and the traditions of EFG GmbH was transfered to Freiberg Instruments GmbH
Arthur Bradaczek at the Siemens X-ray lab in the "Werner Werk" in Berlin (1928)
Prof. Dr. Hans Bradaczek installing a QSA 22L in Singapur (1994)
Dr. Hans-Arthur Bradaczek with QSA 55L (2000)