DDCOM

Ultra-fast Omega-scan approach

• 200 times faster than Theta-scan method

• Automatic evaluation of the complete lattice orientation in 3D

• Determination of entire crystal orientation within 5 seconds

Compact, user friendly and cost effective

• Easily movable and lightweight desktop design

• Convenient sample handling and easy to operate

• Low energy consumption and operating costs due to air cooled X-ray tube (no water cooling required)

Efficient workflows for quality control

• For standard research and industrial workflows

• Azimuthal setting and marking of crystal orientation

• Preprogrammed cubic crystal parameters

• State-of-the-art and convenient software

• High precision, i.e up to (1/100)°

Control of cutting, grinding and lapping

• Complete lattice orientation of single crystals

• Suitable for a unique variety of materials in a large range of size and weight, such as: Wafers from 2-12” and Ingots up to 20kg

Highlights

Examples of measurable materials

• Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

• Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC₃C, PbS, PbTe, SnTe, MgO, LiF, MgAl₂O₄, SrTiO₃, LaTiO₃

• Tetragonal: MgF₂, TiO₂, SrLaAlO₄

• Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO₃, SiO₂ (quartz), Al₂O₃ (sapphire), GaPO₄, La₃Ga₅SiO₁₄

• Orthorhombic: Mg₂SiO₄, NdGaO₃

• Further materials according to the customers' demands

Options

• Device for mapping of wafers (maximum diameter 225 mm)

• Device for automatic loading from cassettes

Omega-scan method