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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
For ultra-fast crystal orientation measurement using the Omega-scan method
The Desktop X-ray Diffractometer for Crystal Orientation Measurement (DDCOM) is an automated tool to determine the orientation of various crystals using the Omega-scan method.
200 times faster than Theta-scan method
Automatic evaluation of the complete lattice orientation in 3D
Determination of entire crystal orientation within 5 seconds
Easily movable and lightweight desktop design
Convenient sample handling and easy to operate
Low energy consumption and operating costs due to air cooled X-ray tube (no water cooling required)
For standard research and industrial workflows
Azimuthal setting and marking of crystal orientation
Preprogrammed cubic crystal parameters
State-of-the-art and convenient software
High precision, i.e up to (1/100)°
Complete lattice orientation of single crystals
Suitable for a unique variety of materials in a large range of size and weight, such as: Wafers from 2-12” and Ingots up to 20kg
Determination of the complete lattice orientation of single crystals
Ultra-fast crystal orientation measurement using the Omega-scan method
Determination of the arbitrary unknown orientation of cubic crystals
Designed especially for azimuthal setting and marking of lattice directions
Air cooled X-ray tube, no water cooling required
Appropriate for research and production quality control
Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP
Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3
Tetragonal: MgF2, TiO2, SrLaAlO4
Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14
Orthorhombic: Mg2SiO4, NdGaO3
Further materials according to the customers' demands
Device for mapping of wafers (maximum diameter 225 mm)
Device for automatic loading from cassettes
In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...