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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
The Omega Scan is able to determine the complete crystal orientation in one measurement. Therefore the in-plane directions can be identified directly. This is a useful feature for marking in-plane directions or checking the orientation of flats or notches.
During implantation and photolithography of wafers the flat or notch serves as orientation mark. After processing, the wafer carries hundreds of chips that need to be separated by cleaving. The chips must be aligned correctly to a lattice plane of easy cleaving in the wafer. Therefore checking of the position of the flat or notch is necessary. For determining the flat or notch position the in-plane components must be measured.
The Omega Scan is able to determine the complete crystal orientation in one measurement. Therefore the in-plane directions can be identified directly. Using the Theta Scan method is either complicated or imprecise.
The instrument can turn any in-plane direction into a specific position defined by the user by rotating the turntable. This simplifies the task to apply a marking to a specific in-plane direction, for example when a flat orientation must be defined. For high-throughput applications, automatic measurement solutions exist.
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more