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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more
Si | SiC | AlN | GaAs | Quartz | LiNbO3 | BBO and 100 more materials
Established Omega-scan method
Measurement speed: < 5 secs/sample
Easy integration into process line
MES and/or SECS/GEM interfaces
Typical standard deviation tilt (example: Si 100): < 0.003 °, minimum < 0.001 °
The Omega/Theta X-ray diffractometer is a fully automated vertical three axes diffractometer for orientation determination for various crystals using Omega-Scan and Theta-Scan methods and rocking curve measurements. The large and spacious design can accomodate samples and sample holders up to 450 mm in length and up to 30 kg weight.
All measurements are automated and can be accessed from the user-friendly software interface. Using the Omega Scan, the complete lattice orientation can be determined in on crystal rotation (5 seconds). The Theta Scan is more flexible, but results only in one orientation component per scan.
The tilt angle can be determined with very high precision; up to 0.001° using the Theta Scan. For all other crystal directions the precision depends on the angular difference to the surface perpendicular.
The system is modular and has been equipped with many different extensions for special purposes like shape or flat determination, mapping and diverse sample holders. The sample tilt is detected by an optical measurement, and can be used to correct the resulting orientation.
Laser scanner for sample shape measurement
Photographic camera and image processing for flat and notch detection
Additional sample rotation axis for 3D mapping
Secondary channel-cut collimator (analyzer)
Equipment for sample adjustment
Single crystal diffractometer
Fully automated complete lattice orientation measurement of single crystals
Ultra-fast crystal orientation measurement using Omega-scan method
Automated rocking-curve measurement
Angular resolution of the diffractometer: 0.1 arc sec.
Sample size up to 450 mm
Appropriate for production quality control and research
User friendly and cost effective
Convenient sample handling and easy to operate
Advanced, user-friendly software
Low energy consumption and operating costs
Modular design and flexibility
Various upgrade options
Customization to the users' requirements
Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.
Components built from NLO materials have to fulfill high quality standards at the crystal surface and within the bulk material. The surface quality measurement can be combined with XRD orientation determination in one machine.
In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...
Rocking curve measurements are sensitive to defects and strain fields within the crystal lattice. Combining this technique with a mapping stage allows to scan a crystal surface and determine faulty areas. In lattice matched thin films, rocking curves can also be used to study layer thickness,...