Omega/Theta XRD

for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more

Exclusively through Malvern Panalytical

Contact for demo

Product Sheet

Established Omega-scan method

All measurements are automated and can be accessed from the user-friendly software interface
Using the Omega Scan, the complete lattice orientation can be determined in on crystal rotation (5 seconds)
The Theta Scan is more flexible, but results only in one orientation component per scan

Materials

Our Omega/Theta XRD systems enable precise analysis across a wide range of materials. Designed for flexibility and exceptional performance, they effortlessly meet the most demanding industry requirements.

Si SiC AIN GaAs Quartz LiNbO₃ BBO and more

Features & Benefits

< 5 s/sample

Measurement speed

Up to
450 mm

Sample size

0.1 arc sec

Angular resolution of the diffractometer

Ultra-fast

crystal orientation measurement

Ultra-fast

crystal orientation measurement

Single crystal diffractometer

Fully automated complete lattice orientation measurement of single crystals
Ultra-fast crystal orientation measurement using Omega-scan method
Automated rocking-curve measurement
Angular resolution of the diffractometer: 0.1 arc sec.
Sample size up to 450 mm
Appropriate for production quality control and research

User friendly and cost effective

Convenient sample handling and easy to operate
Advanced, user-friendly software
Low energy consumption and operating costs

Modular design and flexibility

Various upgrade options
Customization to the users' requirements

Turbine blade, map of one orientation component

Established Omega-scan method

The Omega/Theta X-ray diffractometer is a fully automated vertical three axes diffractometer for orientation determination for various crystals using Omega-Scan and Theta-Scan methods and rocking curve measurements. The large and spacious design can accomodate samples and sample holders up to 450 mm in length and up to 30 kg weight.

All measurements are automated and can be accessed from the user-friendly software interface. Using the Omega Scan, the complete lattice orientation can be determined in on crystal rotation (5 seconds). The Theta Scan is more flexible, but results only in one orientation component per scan.

The tilt angle can be determined with very high precision; up to 0.001° using the Theta Scan. For all other crystal directions the precision depends on the angular difference to the surface perpendicular.

The system is modular and has been equipped with many different extensions for special purposes like shape or flat determination, mapping and diverse sample holders. The sample tilt is detected by an optical measurement, and can be used to correct the resulting orientation.