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Simulation of carrier profiles

For a better understanding of lifetime measurements and to achieve a better comparability between different measuring methods, it is necessary to perform simulations.

Lifetime simulations

To gain a better understanding of lifetime measurements and to achieve a better comparability between different measuring methods, it is necessary to perform simulations.

Simulation of carrier profiles

For measurements at thick samples like ingots, it is very important to simulate the carrier depth profile, that developes in the sample. The measured lifetime is strongly effected by this profile, so that this effect has to be taken into account.

MPD series / µPCD

µPCD/MDP (QSS)

PID series

XRD series / X-ray diffraction

X-ray diffraction

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