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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
The Omega-scan is a fast, simple and reliable way to determine single crystal orientation. Freiberg Instruments is the only company offering this high-end technique.
for ultra-fast crystal orientation and rocking-curve measurements
bar alignment, wafer testing, blank sorting (AT, SC, TF, IT, X, Y, Z)
for ultra-fast crystal orientation using Omega Scan method
Inline metrology for sample alignment within sawing or grinding equipment
for ultrafast crystal orientation in research and pilot plant production
Freiberg Instruments manufactures diffractometers and automated in-line solutions for crystal lattice orientation and sample alignment.
We specialize in the ultra-fast and precise Omega-scan method that allows determination of the complete crystal orientation in a few seconds. By adding 2D (X-Y) or 3D mapping, rocking-curve measurement in combination with full automation, our diffractometers are an integral part of quality control for single crystal manufacturers. Our XRD devices can handle boules, ingots, wafers, bars, panels, rods and other forms of crystals.
Our XRD devices operate 24 h in production environment, aligning crystals for sawing or grinding, determining the flat's or notch's position and checking the final product (wafer, blank, etc.)