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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Ultra-fast orientation measurement technique of crystalline samples
Advantages of the Omega-Scan Method:
Stable and simple arrangement (X-ray tube and detector in fixed positions, only one measuring circle, no monochromator).
All the data necessary for the complete orientation determination is measured in one rotation
High precision at low measuring time
From these reasons, the method is suited especially for serial measurements and industrial applications.
The specimen is turned by 360° around a certain axis, e.g., the surface normal. The X-ray source and the detector have to be adjusted depending on the crystal type to get a sufficient number of reflections per turn. The angular positions of these reflections are used to evaluate the orientation of the crystal lattice (completely described by three angles) with relation to the rotation axis.
In order to relate the lattice orientation exactly to the surface of a crystal, the direction of the surface is checked by a laser beam. Also other relevant crystal reference faces or directions can be measured by optical tools in a similar way. This measuring technique enables to determine the orientation of arbitrary single crystals in any orientation range with high precision. Usually, a measuring time of some seconds (during one or a few turns of the specimen) is sufficient to get a reproducibility in the range of a few arc seconds. A special application of the Omega-Scan Method is the precision lattice-parameter determination, especially of cubic crystals.