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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test for solar wafers and mini-modules
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
The PIDcon allows routine quality control of the PID susceptibility of solar cells in a short time and independent from the influence of EVA and glass.
Potential induced degradation (PID) is a serious reliability problem in PV power plants. Hence it is important to investigate its products on their PID susceptibility. The aim of the PIDcon is to enable the producers to test their product a searly as possible in the production chain on solar cell level and to investigate the encapsulation materials as well. Hence the influence of the solar cell and its SiNx layer can be investigated independently from the influence of the EVA and glass. Note that the PID that is considered here is the shunting of the solar cells due to high voltage stress induced leakage currents (PID-s).
In order to classify solar cells, it is important to use sensitive EVA and glass so that the solar cell is the criticall parameter for the PID sensitivity of the whole stack. It is possible to add a lamination step prior to the actual measurement to improve the comparability to the actual modules. The solar cells are contacted via golden contact pins, which can be adjusted to the bus bar design of the solar cells, even island busbars are possible. The software PIDStudio enables the user to set a pass and fail criterion and it also suggests one according to the IEC standard and experience of the scientist from Fraunhofer CSP.