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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Fast, contactless characterization of key electro-optical material parameters
Surface photovoltage (SPV) characterization is a well-established method for characterizing bulk, interface and surface related effects in electro-optical materials. Mostly the measurements are performed in well-equipped laboratories and research institutions. There is only a few commercially tools and equipment available on the market, and most of them have been developed for special applications – like for instance diffusion-length measurements in silicon photovoltaic materials.
The new Freiberg Instruments` Surface photovoltage spectroscopy (SPS/SPV) product platform is a game changer in the sense that any electro-optical material can be analysed – from powder based over nano-particle structures to 300 mm silicon wafers. The FSPS/SPV product platform covers solutions and needs for production floor, fast and accurate analysis of the material output quality and for research and development of new electro-optical materials or material combinations. Extensive research and development over many years have proved the versatility and usefulness of this product platform in such diverse applications as defect characterization of silicon, silicon carbide and wide bandgap semiconductors such as gallium oxide and diamond, time-resolved charge dynamics in photocatalytic materials such as copper oxide or titanium oxide and a number of other applications.
Contact us for a consultation of the best suited configuration for your analysis tasks.
High sensitivity, high resolution Surface Photovoltage (SPV) measurement instrument for QA/QC inspection of production material and advanced material research & development.
High sensitivity, high resolution Surface Photovoltage Spectroscopy (SPS) measurement instrument for advanced material research and development and QA/QC inspection.