Surface Photovoltage (SPV) and Surface Photovoltage Spectroscopy (SPS)

Surface photovoltage (SPV) characterization is a well-established method for characterizing bulk, interface and surface related effects in electro-optical materials. Mostly the measurements are performed in well-equipped laboratories and research institutions. There is only a few commercially tools and equipment available on the market, and most of them have been developed for special applications – like for instance diffusion-length measurements in silicon photovoltaic materials.

The new Freiberg Instruments` Surface photovoltage spectroscopy (SPS/SPV) product platform is a game changer in the sense that any electro-optical material can be analysed – from powder based over nano-particle structures to 300 mm silicon wafers. The FSPS/SPV product platform covers solutions and needs for production floor, fast and accurate analysis of the material output quality and for research and development of new electro-optical materials or material combinations. Extensive research and development over many years have proved the versatility and usefulness of this product platform in such diverse applications as defect characterization of silicon, silicon carbide and wide bandgap semiconductors such as gallium oxide and diamond, time-resolved charge dynamics in photocatalytic materials such as copper oxide or titanium oxide and a number of other applications.

Contact us for a consultation of the best suited configuration for your analysis tasks.