Surface Photovoltage Spectroscopy

Surface Photovoltage Spectroscopy (SPS/SPV) is a proven technique for analyzing bulk, interface, and surface-related properties in electro-optical materials. Traditionally limited to specialized labs, commercial SPV solutions remain scarce, often restricted to niche applications.

Freiberg Instruments’ HR-SPS platformredefines material characterization with high-resolution, contactless analysis for virtually any electro-optical material – from powder-based samples, nanoparticle structures to 300 mm silicon wafers. Designed for both production and research, it enables rapid, precise assessments for manufacturing and material innovation.

With applications spanning defect characterization in semiconductors (silicon, silicon carbide, and wide-bandgap semiconductors like gallium oxide and diamond), charge dynamics analysis in photocatalysts (copper oxide and titanium oxide), and beyond, HR-SPS brings unparalleled versatility and efficiency to SPV analysis.