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Electrical Characterization

The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their electrical properties. 

Electrical characterization – important material parameters

The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their electrical properties. With the development of the advanced method MDP (microwave detected photoconductivity) it is possible to measure these very important electrical parameters with so far not achieved sensitivity, resolution and speed.

Minority carrier lifetime

The minority carrier lifetime is one of the most important and significant material parameters. It is extremely sensitive to smallest amounts of impurities or intrinsic defects and hence an ideal parameter for inline characterization of material...

Photoconductivity

When light of sufficient energy is absorbed by a semiconductor, the number of free electrons and holes changes and raises the electrical conductivity of the semiconductor.

Resistivity

Mobility

The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can decelerate the free carriers, like collisions with the...

Diffusion length

Defect properties

For the efficiency of solar cells the properties of a defect and its impact on the material quality are of great importance .

MPD series / µPCD

µPCD/MDP (QSS)

PID series

PID

XRD series / X-ray diffraction

X-ray diffraction

Branches

Projects

Projects

Company

Company