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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products manufactured on crystalline surfaces everyday in our electronic devices. New applications for single crystals emerge continuously as older ones are disappearing due to the technological progress.
The growth of single crystal material is a technologically and economically challenging business. The starting materials must be highly purified and contaminations need to be minimized during crystal growth and processing. Continuous measurements of product quality indicators like orientation and homogeneity are a key to economical success.
The production of silicon dominates the market for single crystals. Other semiconductors and metals are produced on much smaller scale. The market share of wide-bandgap semiconductors like gallium nitride and insulators like sapphire is currently increasing. Laser optics are an important application field for crystals like garnets, borates and other transparent oxides. The importance of piezoelectric single crystals like quartz has decreased in the last years, and many applications of these materials do not require single crystals.
Freiberg Instruments offers customized X-ray diffraction solutions for single crystal orientation and quality control.
orientation determination find the crystallographic orientation of a single crystal surface with the ultra-fast Omega Scan method, or use the flexible Theta Scan
crystal quality measure the Rocking Curve half-width to characterize your material
surface mapping raster scan a crystal surface for orientation or Rocking Curve maps
engineering: construction and automation together with our customers, we design tailor-made solutions
3D-mapping of crystalline turbine blades made from NI-superalloys
The quality of a crystal is not exactly measurable. However we can compare measurements on several physical properties to standards for clean and ordered crystals. With XRD, the relevant property is called the Rocking Curve of a reflection.
In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...
Components built from NLO materials have to fulfill high quality standards at the crystal surface and within the bulk material. The surface quality measurement can be combined with XRD orientation determination in one machine.
Mapping of crystalline surfaces for the determination of the orientation distribution
In the production of oscillators and filters the cutting of blanks from bars is an essential step for achieving the right cutting angle of the blanks that influences the temperature behavior of the final product.
Sorting of quartz blanks for AT, SC, FC, IT cut
Rocking curve measurements are sensitive to defects and strain fields within the crystal lattice. Combining this technique with a mapping stage allows to scan a crystal surface and determine faulty areas. In lattice matched thin films, rocking curves can also be used to study layer thickness,...
Our diffractometers are designed for large and heavy single crystals. In particular industrial applications are in the focus of our designs.