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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material...
state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding
Wafer sorting, crystal orientation, resistivity, optical notch and flat determination
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Mono- and Multi-crystalline wafer lifetime measurement device
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
for production and quality control of monocrystalline Si ingots,bricks and wafers
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
for contactless and temperature dependent lifetime and LBIC measurements
High Resolution Resistivity Mapping Tool for process control and quality assurance measurements
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
High sensitivity, high resolution surface photovoltage (SPV) measurement instrument
High sensitivity, high resolution surface photovoltage spectroscopy (SPS) instrument with a variable energy excitation source...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Freiberg Instruments and Ajuba forge a transformative partnership for India Semiconductor Ecosystem. Freiberg Instruments and Ajuba partner together for research & development, and skill-building for India. In tandem with Ajuba's SKILL program with…
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Malvern Panalytical, a leading analytical instrumentation supplier, today announces it has acquired the product line for six X-ray diffraction (XRD) products from Freiberg Instruments GmbH. The acquisition supports Malvern Panalytical's growth…
February 10, 2023
An analysis of the state of a semiconductor – from start wafer until final device – is considered a job for specialists and there are very few analysis tools that can be used as a “decision maker” for good and/or bad material…
March 23, 2021
Freiberg - Award-winning innovation: Freiberg Instruments GmbH from Freiberg (Saxony) has been awarded the TOP 100 seal for 2021. This is the 28th time that particularly innovative medium-sized companies are honored with this award.…
January 10, 2020
Following a very successful 2018 and 2019, Freiberg Instruments looks to continue its global growth with the opening of new office in January 2020.
The new office in Shanghai marks an important move into mainland China for the…
November 16, 2018
Freiberg Instruments today announced that it is doubling its production capacity via an addition to its headquarters building in Freiberg, Germany. The building addition will house not only an additional modern area for production…
µPCD/MDP (QSS)
PID
X-ray diffraction
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