Fast, contactless characterization of semiconductor key parameters

Visualization of semiconductor quality is achieved by widely advanced microwave techniques. Which allow for a mapping of key electrical semiconductor parameters contactless and with production speed. Measurement of parameters like minority carrier lifetime, photoconductivity, resistivity and defect information can be mapped by a so far unsurpassed combination of spatial resolution, sensitivity and measurement speed. This approach enables a wide field of established and new applications for semiconductor production and research.

The family of MDP tools covers a wide range of applications from easy to integrate OEM units over high throughput, automated production tools to research and trouble shooting tools with a high flexibility always focused on the task which has to be solved. Reliability and roughed design together with the integration of newest electronic possibilities make MDP tools the perfect partner for upcoming needs on high speed contactless electrical semiconductor characterization.