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SDCOM

a desktop XRD device for material research, production and quality control of single crystals (Ingots & Wafers)

 

Si | SiC | Diamond| AlN | GaAs | Quartz | LiNbO3 | BBO | GaN and 100s more

Features of SDCOM

  • Ability to measure very small crystals down to 1 mm or larger samples

  • Variety of sample holders and transfer fixtures towards wire saw, grinding, etc.

  • Marking option of lateral crystal direction

  • No water cooling

  • Highest precision: 0.01° (depending on crystal quality)

  • Determination of the complete lattice orientation of single crystals

  • Ultra-fast crystal orientation measurement using the Omega-scan method

  • Air cooled X-ray tube, no water cooling required

  • Appropriate for research and production quality control

  • manual handling (no automation option)

  • Crystal orientation is determined by reflex position
  • suitable for a vast variety of materials

Examples of measurable materials

  • Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

  • Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3

  • Tetragonal: MgF2, TiO2, SrLaAlO4

  • Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14

  • Orthorhombic: Mg2SiO4, NdGaO3

  • Further materials according to the customers' demands

Contact Malvern Panalytical for demo and quotation of SDCOM.

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Contact and Sales

Contact Malvern Panalytical for demo and quotation of SDCOM.

Applications for SDCOM

Marking and measuring of in-plane directions

In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, we can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...

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MPD series / µPCD

µPCD/MDP (QSS)

PID series

PID

XRD series / X-ray diffraction

X-ray diffraction

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