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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test for solar wafers and mini-modules
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
Advancement of Omega-Scan technology for different applications
2018/01/01 – 2020/12/31
Freiberg Instruments is further advancing its Omega-Scan technology for orientation of single crystals for different applications as orientation of diamond and other wide bandgap semiconductors, epitaxial layers, turbine blades and quartz.
The project is funded by the SAB and the EU.
Dr. Nadine Schüler (email@example.com)Dr. Hans-Arthur Bradaczek (firstname.lastname@example.org)
Freiberg Instruments takes part in a project with the goal to develop a method to predict PID recovery and hence the efficiency of a module. Freiberg Instruments is further developing its tool PIDcheck for the PID test of modules in free field and its recovery.
The project is funded by BMWi.
Dr. Nadine Schüler (email@example.com)
2017/05/01 – 2020/04/30
Smart processes – process technology for smart materialsMSM-production and material characterization
Freiberg Instruments is investigating the applicability of x-ray diffraction methods for crystallographic orientation determination on MSM single crystals (Magnetic Shape Memory) in subproject 2 "Process chains for the production of MSM actuator sticks". In the case of a positive evaluation, the closer connection to the subsequent processing steps will be examined and the determination process will be automated.
The project is funded by the BMBF within the Funding project “Zwanzig20”.
2017/01/01 – 2019/12/31
The overall objective of this project is to optimize the production processes of block silicon under industrial conditions with the help of fast and novel methods of quality assessment of bricks and wafers and thus to increase the quality of silicon wafers produced therefrom. This is to be demonstrated by a highly efficient industrial solar cell structure. Freiberg Instruments cooperates in this project with 7 partners from industry and Fraunhofer society.This project is funded by BMWi.
Contact person:Dr. Nadine Schüler (firstname.lastname@example.org)
2013/11/01 – 2017/04/30
The aim of this project is the evaluation of different metrology components for 450 mm wafers. Freiberg Instruments is delivering a measurement head for high resolution lifetime measurements in this project.
Dr. Kay DornichE-Mail: email@example.com
2015/12/01 – 2018/11/30
The objective of this project is to evaluate and improve the cutting edge characterization and technology for the german photovoltaic industry. The main focus are inline metrology tools and the prediction of solar cell efficiency by means of different measured parameters.
Freiberg Instruments is involved in this project with its inline metrology tool MDPinline. The aim is to improve the possibilities of solar cell efficiency prediction via lifetime measurements on wafers after different process steps. Further more typical errors in different process steps are investigated to enable an automatic detection.
This project is supported by BMWi.
Dr. Nadine SchülerE-Mail: firstname.lastname@example.org
2016/01/01 – 2018/12/31
This project involves Freiberg Instruments and the TU Freiberg and has the goal to improve the scientific tool MDPmap for the measurement of wide bandgap semiconductors. This includes
Improvement of the time resolution, in order to be able to measure also small lifetimes (> 10 ns)
Improvement of the sensitivity
Enhancement of temperature range up to 800 K for the investigation of deep defects
This project is funded by SAB and the EU.