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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Delfter Str. 609599FreibergSaxony, Germany
Contact: Mr. Ing. Thanga Kumar E-Mail: firstname.lastname@example.org Website: www.freiberginstruments.com
No.1333 Xinlong Road, No. 30 Building, Room 810201101ShanghaiMinhang District, China
Contact: Ms. Lu Yan Phone: +86-21-64200570 E-Mail: email@example.com Website: www.freiberginstruments.com.cn
No. 21, Taihe Rd30267Zhubei CityHsinchu County, Taiwan
Contact: Ms. Joanna Chen Phone: +886 3 553 6525 Fax: +886 3 553 6515 E-Mail: firstname.lastname@example.org Website: www.challentech.com.tw
#A1107, Bundang Suji U-Tower, 767 Sinsu-ro, Suji-gu16827Gyeonggi-doSouth Korea
Contact: Mr. Han Eok Kim Phone: +82 31 7763 170 Fax: +82 31 7763 176 E-Mail: email@example.com Website: www.elim-global.com
8-7, Roppongi 1-Chome2nd Dept. 3rd Business Div., Ark Yagi HillsTokyoMinato-ku, Japan
Contact: Mr. Jin Imai Phone: +81-3-5114-0852 Fax: +81-3-3583-1330 E-Mail: firstname.lastname@example.org Website: www.correns.co.jp
603 Vakratunda Corporate ParkVishweshwar Nagar400 063MumbaiGoregaon East, India
Contact: Mr. TK Bhattacharya Phone: +91-22-29271664 Fax: +91-22-67255314 E-Mail: email@example.com
1 Raffles Place #44-02 One Raffles Place048616SingaporeTower One, Singapore
Contact: Mr. Perry Lee Phone: +6593638706 Fax: +6564649751 E-Mail: firstname.lastname@example.org Website: www.PLNANO.com
686 Sokak No. 72 Mustafa KemalMah. Buca-IzmirTurkey
Contact: Mr. Ufuk Phone: +90-535-618 38 20 E-Mail: email@example.com
Prostornaya Str. 7107392MoscowRussia
Contact: Mr. Phone: +7 (495) 22-11-208 E-Mail: firstname.lastname@example.org
11 Meadowbrook Road02492Needham, MAUnited States
Contact: Mr. Charlie Kohn Phone: +1 978 808-5415 E-Mail: email@example.com